电阻式存储器件中载流子在有机薄膜中的传输特性

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Nilima Biswas, Koshik Naha, Shyam Kumar Bhattacharjee, Syed Arshad Hussain, Debajyoti Bhattacharjee
{"title":"电阻式存储器件中载流子在有机薄膜中的传输特性","authors":"Nilima Biswas,&nbsp;Koshik Naha,&nbsp;Shyam Kumar Bhattacharjee,&nbsp;Syed Arshad Hussain,&nbsp;Debajyoti Bhattacharjee","doi":"10.1007/s10854-025-14978-7","DOIUrl":null,"url":null,"abstract":"<div><p>The study explored the underlying mechanism of resistive switching behaviour in a Write Once Read Many (WORM) memory device using an organic dye, Methylene Blue (MB), as the active layer. The device architecture consisted of two electrodes: Indium Tin Oxide (ITO) as the bottom electrode and gold (Au) as the top electrode. Our experimental observations revealed the intricate interplay of electrons and holes conduction within the MB layer. The crucial role of the highest occupied molecular orbital (HOMO) and lowest unoccupied molecular orbital (LUMO) energy levels of MB have been elucidated in governing charge carriers transport in the active layer of the memory device. The application of positive and negative bias voltages induced a reversible exchange of dominant charge carriers (electrons and holes) within the device. High temperature studies also showed the same WORM characteristics in the device and also confirmed the nature of charge carriers. The fabricated WORM memory device exhibited good performance characteristics. Notably, it demonstrated good data retention capabilities exceeding 5 h. Furthermore, the device showed a substantial memory window having ON–OFF ratio of the order of 10<sup>3</sup>. The device also exhibited remarkable read endurance, withstanding over 2600 read cycles without significant performance degradation. A high device yield of approximately 74% underscored the robustness and reproducibility of the fabrication process. Moreover, the device maintained excellent stability over an extended period of 150 days, confirming its long-term reliability.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 15","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterization of charge carrier transport in thin organic films used in write once read many resistive memory devices\",\"authors\":\"Nilima Biswas,&nbsp;Koshik Naha,&nbsp;Shyam Kumar Bhattacharjee,&nbsp;Syed Arshad Hussain,&nbsp;Debajyoti Bhattacharjee\",\"doi\":\"10.1007/s10854-025-14978-7\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The study explored the underlying mechanism of resistive switching behaviour in a Write Once Read Many (WORM) memory device using an organic dye, Methylene Blue (MB), as the active layer. The device architecture consisted of two electrodes: Indium Tin Oxide (ITO) as the bottom electrode and gold (Au) as the top electrode. Our experimental observations revealed the intricate interplay of electrons and holes conduction within the MB layer. The crucial role of the highest occupied molecular orbital (HOMO) and lowest unoccupied molecular orbital (LUMO) energy levels of MB have been elucidated in governing charge carriers transport in the active layer of the memory device. The application of positive and negative bias voltages induced a reversible exchange of dominant charge carriers (electrons and holes) within the device. High temperature studies also showed the same WORM characteristics in the device and also confirmed the nature of charge carriers. The fabricated WORM memory device exhibited good performance characteristics. Notably, it demonstrated good data retention capabilities exceeding 5 h. Furthermore, the device showed a substantial memory window having ON–OFF ratio of the order of 10<sup>3</sup>. The device also exhibited remarkable read endurance, withstanding over 2600 read cycles without significant performance degradation. A high device yield of approximately 74% underscored the robustness and reproducibility of the fabrication process. Moreover, the device maintained excellent stability over an extended period of 150 days, confirming its long-term reliability.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":\"36 15\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-05-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-025-14978-7\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-14978-7","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

该研究探索了使用有机染料亚甲基蓝(MB)作为有源层的Write Once Read Many (WORM)存储器件中电阻开关行为的潜在机制。该器件结构由两个电极组成:氧化铟锡(ITO)作为底部电极和金(Au)作为顶部电极。我们的实验观察揭示了MB层中电子和空穴传导的复杂相互作用。阐明了MB的最高已占据分子轨道(HOMO)和最低未占据分子轨道(LUMO)能级在控制存储器件有源层载流子输运中的关键作用。正负偏置电压的应用诱导了器件内主导载流子(电子和空穴)的可逆交换。高温研究也显示了器件中相同的WORM特性,也证实了电荷载流子的性质。所制备的WORM存储器件具有良好的性能特性。值得注意的是,它显示出超过5小时的良好数据保留能力。此外,该器件显示出具有103数量级的开关比的大量内存窗口。该设备还表现出卓越的读取耐久性,承受超过2600次读取周期而没有明显的性能下降。约74%的高器件产率强调了制造过程的稳健性和可重复性。此外,该设备在长达150天的时间内保持了出色的稳定性,证实了其长期可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characterization of charge carrier transport in thin organic films used in write once read many resistive memory devices

The study explored the underlying mechanism of resistive switching behaviour in a Write Once Read Many (WORM) memory device using an organic dye, Methylene Blue (MB), as the active layer. The device architecture consisted of two electrodes: Indium Tin Oxide (ITO) as the bottom electrode and gold (Au) as the top electrode. Our experimental observations revealed the intricate interplay of electrons and holes conduction within the MB layer. The crucial role of the highest occupied molecular orbital (HOMO) and lowest unoccupied molecular orbital (LUMO) energy levels of MB have been elucidated in governing charge carriers transport in the active layer of the memory device. The application of positive and negative bias voltages induced a reversible exchange of dominant charge carriers (electrons and holes) within the device. High temperature studies also showed the same WORM characteristics in the device and also confirmed the nature of charge carriers. The fabricated WORM memory device exhibited good performance characteristics. Notably, it demonstrated good data retention capabilities exceeding 5 h. Furthermore, the device showed a substantial memory window having ON–OFF ratio of the order of 103. The device also exhibited remarkable read endurance, withstanding over 2600 read cycles without significant performance degradation. A high device yield of approximately 74% underscored the robustness and reproducibility of the fabrication process. Moreover, the device maintained excellent stability over an extended period of 150 days, confirming its long-term reliability.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信