基于Hammerstein架构的非侵入式数据驱动模型降阶电路

IF 2.9 3区 计算机科学 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Joshua Hanson;Paul Kuberry;Biliana Paskaleva;Pavel Bochev
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引用次数: 0

摘要

我们证明了系统识别技术可以为通用电路提供有效的、非侵入式的模型阶数降低(MOR)的基础,这些电路是微电子学的关键组成部分。我们的方法是由这些电路的实际操作驱动的,并利用了规范的Hammerstein架构。为了演示这种方法,我们为非线性CMOS差分放大器和运算放大器电路建立了简洁的Hammerstein模型。我们在直流(DC)和瞬态SPICE电路仿真数据的组合上训练这些模型,使用一种新的顺序策略来识别它们的静态非线性和线性动态部分。仿真结果表明,Hammerstein模型是这些类型电路的有效替代品,可以在广泛的工作点和输入频率范围内准确有效地再现其行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nonintrusive Data-Driven Model Order Reduction for Circuits Based on Hammerstein Architectures
We demonstrate that system identification techniques can provide a basis for effective, nonintrusive model order reduction (MOR) for common circuits that are key building blocks in microelectronics. Our approach is motivated by the practical operation of these circuits and utilizes a canonical Hammerstein architecture. To demonstrate the approach we develop parsimonious Hammerstein models for a nonlinear CMOS differential amplifier and an operational amplifier circuit. We train these models on a combination of direct current (DC) and transient SPICE circuit simulation data using a novel sequential strategy to identify their static nonlinear and linear dynamical parts. Simulation results show that the Hammerstein model is an effective surrogate for these types of circuits that accurately and efficiently reproduces their behavior over a wide range of operating points and input frequencies.
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来源期刊
CiteScore
5.60
自引率
13.80%
发文量
500
审稿时长
7 months
期刊介绍: The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.
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