增强文档去翘曲评估:提高准确性和效率的新度量

IF 3.9 3区 计算机科学 Q2 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE
Jiaxin Zhang , Peirong Zhang , Dezhi Peng , Haowei Xu , Lianwen Jin
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引用次数: 0

摘要

近年来,文档图像去翘曲问题引起了人们的广泛关注。随着一系列先进模型的发展,在各种基准数据集上的性能有了相当大的提高,量化结果也越来越好。然而,最近的一些研究表明,常用的评估指标可能并不一致地代表去翘曲性能,导致评估结果与人类的感知判断之间存在差异。虽然最近提出了一些替代指标,但它们的功效尚未得到充分验证,我们发现它们的性能仍然不是最佳的。为了解决这些问题,我们提出了一个新的指标,称为DocAligner失真(DD),以减轻现有指标中观察到的缺陷。我们对DD和当前用于文档图像去翘曲的度量进行了全面的比较和分析。结果表明,DD在精度和效率上明显优于之前的方法。代码可在https://github.com/ZZZHANG-jx/DocAligner-Distortion上获得。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhancing document dewarping evaluation: A new metric with improved accuracy and efficiency
Recently, the task of document image dewarping has garnered significant attention. With the development of a series of advanced models, the performance on various benchmark datasets has seen considerable improvement, as evidenced by the increasingly better quantitative outcomes. However, several recent studies have unveiled that the commonly used evaluation metrics may not consistently represent the dewarping performance, leading to discrepancies between evaluation results and human perceptual judgments. While some alternative metrics have been recently proposed, their efficacy has not been fully validated, and we found that their performance remains suboptimal. To address these issues, we propose a new metric, termed DocAligner Distortion (DD), to mitigate the deficiencies observed in existing metrics. We conduct comprehensive comparisons and analyses between DD and the prevailing metrics used in document image dewarping. Results demonstrate that DD significantly outperforms its predecessors with better accuracy and efficiency. Codes are available at https://github.com/ZZZHANG-jx/DocAligner-Distortion.
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来源期刊
Pattern Recognition Letters
Pattern Recognition Letters 工程技术-计算机:人工智能
CiteScore
12.40
自引率
5.90%
发文量
287
审稿时长
9.1 months
期刊介绍: Pattern Recognition Letters aims at rapid publication of concise articles of a broad interest in pattern recognition. Subject areas include all the current fields of interest represented by the Technical Committees of the International Association of Pattern Recognition, and other developing themes involving learning and recognition.
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