Christian Padovani;Luca Pileri;Leonardo Gaffuri Pagani;Philippe Robert;Giacomo Langfelder
{"title":"调制静电软化应用于调频MEMS加速度计的机遇与挑战","authors":"Christian Padovani;Luca Pileri;Leonardo Gaffuri Pagani;Philippe Robert;Giacomo Langfelder","doi":"10.1109/TIM.2025.3565346","DOIUrl":null,"url":null,"abstract":"This work advances the research on time-switched frequency-modulated (FM) accelerometers by presenting both a new device and a new measurement architecture. The sensor exploits nanopiezoresistive gauges to minimize the oscillator frequency noise down to sub-sub-10 <inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>g/<inline-formula> <tex-math>$\\sqrt {\\text {Hz}}$ </tex-math></inline-formula> equivalent acceleration density, while at the same time holding almost 100-g full-scale. The corresponding dynamic range is promising for several applications; however, this article also shows how the theoretical performance is affected by noise associated with a pair of modulating voltage waveforms, required by the specific working principle. Exploiting a digital generation of these waves and low-noise digital-to-analog converters (DACs), the effect is only partially mitigated. Nevertheless, the system experimentally reaches up to 65-g full-scale and holds as low as 30-<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>g stability at almost 1000-s observation interval.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-9"},"PeriodicalIF":5.6000,"publicationDate":"2025-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Opportunities and Challenges in Using Modulated Electrostatic Softening in FM MEMS Accelerometers\",\"authors\":\"Christian Padovani;Luca Pileri;Leonardo Gaffuri Pagani;Philippe Robert;Giacomo Langfelder\",\"doi\":\"10.1109/TIM.2025.3565346\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work advances the research on time-switched frequency-modulated (FM) accelerometers by presenting both a new device and a new measurement architecture. The sensor exploits nanopiezoresistive gauges to minimize the oscillator frequency noise down to sub-sub-10 <inline-formula> <tex-math>$\\\\mu $ </tex-math></inline-formula>g/<inline-formula> <tex-math>$\\\\sqrt {\\\\text {Hz}}$ </tex-math></inline-formula> equivalent acceleration density, while at the same time holding almost 100-g full-scale. The corresponding dynamic range is promising for several applications; however, this article also shows how the theoretical performance is affected by noise associated with a pair of modulating voltage waveforms, required by the specific working principle. Exploiting a digital generation of these waves and low-noise digital-to-analog converters (DACs), the effect is only partially mitigated. Nevertheless, the system experimentally reaches up to 65-g full-scale and holds as low as 30-<inline-formula> <tex-math>$\\\\mu $ </tex-math></inline-formula>g stability at almost 1000-s observation interval.\",\"PeriodicalId\":13341,\"journal\":{\"name\":\"IEEE Transactions on Instrumentation and Measurement\",\"volume\":\"74 \",\"pages\":\"1-9\"},\"PeriodicalIF\":5.6000,\"publicationDate\":\"2025-04-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Instrumentation and Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10980074/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10980074/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Opportunities and Challenges in Using Modulated Electrostatic Softening in FM MEMS Accelerometers
This work advances the research on time-switched frequency-modulated (FM) accelerometers by presenting both a new device and a new measurement architecture. The sensor exploits nanopiezoresistive gauges to minimize the oscillator frequency noise down to sub-sub-10 $\mu $ g/$\sqrt {\text {Hz}}$ equivalent acceleration density, while at the same time holding almost 100-g full-scale. The corresponding dynamic range is promising for several applications; however, this article also shows how the theoretical performance is affected by noise associated with a pair of modulating voltage waveforms, required by the specific working principle. Exploiting a digital generation of these waves and low-noise digital-to-analog converters (DACs), the effect is only partially mitigated. Nevertheless, the system experimentally reaches up to 65-g full-scale and holds as low as 30-$\mu $ g stability at almost 1000-s observation interval.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.