{"title":"基于偏转离焦特征提取的微尺度三维旋转估计","authors":"Zijian Zhu;Qinghong Wan;Yingxue Yao;Yueping Xi;Chenyang Zhao","doi":"10.1109/TIM.2025.3565116","DOIUrl":null,"url":null,"abstract":"In micro-electromechanical systems (MEMSs), measuring 3-D rotation presents challenges such as an unclear rotation center and poor orthogonality. Microvision-based rotation estimation is limited by a shallow imaging depth of field, leading to a narrow measurement range and low precision. This article introduces a novel method called deflected defocused feature extraction (DFE) to address these issues and enable accurate microscale rotation estimation. DFE extends the measurement range from 0.03 to 0.92 rad while achieving a precision of 0.1179 mrad for out-of-plane angles. The edge defocus model incorporating deflection angle is derived based on microscopic imaging principles. A general circular array is fabricated and a robust defocus control point extraction method is proposed. Finally, 3-D angular displacement measurement is accomplished via homography matrix decomposition. Experimental results demonstrate a resolution of 0.17, 0.17, and 0.0087 mrad for the three axes. The range-to-resolution ratios are found to be <inline-formula> <tex-math>$10^{4}$ </tex-math></inline-formula>, <inline-formula> <tex-math>$10^{4}$ </tex-math></inline-formula>, and <inline-formula> <tex-math>$10^{6}$ </tex-math></inline-formula>.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-11"},"PeriodicalIF":5.6000,"publicationDate":"2025-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microscale 3-D Rotation Estimation Based on Deflected Defocused Feature Extraction\",\"authors\":\"Zijian Zhu;Qinghong Wan;Yingxue Yao;Yueping Xi;Chenyang Zhao\",\"doi\":\"10.1109/TIM.2025.3565116\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In micro-electromechanical systems (MEMSs), measuring 3-D rotation presents challenges such as an unclear rotation center and poor orthogonality. Microvision-based rotation estimation is limited by a shallow imaging depth of field, leading to a narrow measurement range and low precision. This article introduces a novel method called deflected defocused feature extraction (DFE) to address these issues and enable accurate microscale rotation estimation. DFE extends the measurement range from 0.03 to 0.92 rad while achieving a precision of 0.1179 mrad for out-of-plane angles. The edge defocus model incorporating deflection angle is derived based on microscopic imaging principles. A general circular array is fabricated and a robust defocus control point extraction method is proposed. Finally, 3-D angular displacement measurement is accomplished via homography matrix decomposition. Experimental results demonstrate a resolution of 0.17, 0.17, and 0.0087 mrad for the three axes. The range-to-resolution ratios are found to be <inline-formula> <tex-math>$10^{4}$ </tex-math></inline-formula>, <inline-formula> <tex-math>$10^{4}$ </tex-math></inline-formula>, and <inline-formula> <tex-math>$10^{6}$ </tex-math></inline-formula>.\",\"PeriodicalId\":13341,\"journal\":{\"name\":\"IEEE Transactions on Instrumentation and Measurement\",\"volume\":\"74 \",\"pages\":\"1-11\"},\"PeriodicalIF\":5.6000,\"publicationDate\":\"2025-04-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Instrumentation and Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10979513/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10979513/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Microscale 3-D Rotation Estimation Based on Deflected Defocused Feature Extraction
In micro-electromechanical systems (MEMSs), measuring 3-D rotation presents challenges such as an unclear rotation center and poor orthogonality. Microvision-based rotation estimation is limited by a shallow imaging depth of field, leading to a narrow measurement range and low precision. This article introduces a novel method called deflected defocused feature extraction (DFE) to address these issues and enable accurate microscale rotation estimation. DFE extends the measurement range from 0.03 to 0.92 rad while achieving a precision of 0.1179 mrad for out-of-plane angles. The edge defocus model incorporating deflection angle is derived based on microscopic imaging principles. A general circular array is fabricated and a robust defocus control point extraction method is proposed. Finally, 3-D angular displacement measurement is accomplished via homography matrix decomposition. Experimental results demonstrate a resolution of 0.17, 0.17, and 0.0087 mrad for the three axes. The range-to-resolution ratios are found to be $10^{4}$ , $10^{4}$ , and $10^{6}$ .
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.