X-ray computed laminography: A brief review of mechanisms, reconstruction, applications and perspectives

X-ray computed tomography (CT) has the capacity to reveal the internal details of objects in three-dimensions, non-destructively. Since the 1980s, X-ray CT has been accepted as a well-established tool for a wide range of scientific and engineering research endeavours. The sample is rotated about an axis perpendicular to the incident X-ray beam during CT acquisition. The spatial resolution of CT scans may be compromised for large, flat (high-aspect-ratio) samples due to constraints imposed by the geometrical setting. The recent development of X-ray computed laminography (CL) offers a great opportunity to overcome several limitations by using an angled axis of rotation, which could complement CT characterisation. Like X-ray CT, CL is also capable of acquiring 3D image datasets for the extraction of volumetric parameters, such as phase fractions and damage levels. Herein, we review the research on X-ray CL over the past three decades and the current state of the field, including its advantages and disadvantages, characteristics, methods and setup, data reconstruction and computational software, and applications. Finally, the outlook for future research opportunities and challenges is briefly discussed. The preliminary attempts to implement CL for electrochemical devices are presented with a focus on research pertaining to pilot-scale solid-state pouch batteries.