基于数据冗余条件的螺旋CT几何参数自标定方法。

IF 3.2 2区 物理与天体物理 Q2 OPTICS
Optics express Pub Date : 2025-04-07 DOI:10.1364/OE.559208
Bozhong Tan, Jinming Cheng, Qingguo Yang
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引用次数: 0

摘要

CT系统的几何参数对重建图像的质量和尺寸测量的精度影响很大。为了实现这些参数的精确标定,本研究开发了一种基于数据冗余条件的螺旋CT几何自标定方法。对螺旋扫描轨迹下满足数据冗余的几何关系进行了理论分析。利用仿真数据,我们研究了三个关键几何参数——源到样本距离、探测器的水平偏移量和探测器平面的旋转角度——对数据冗余的影响。此外,我们研究了不同的噪声水平如何影响几何参数估计的准确性。最后,通过真实样本的螺旋CT扫描实验验证了所提方法的有效性。结果表明,探测器水平偏移量的计算精度优于1个像素,探测器平面旋转角度精度超过0.1°,源样距离精度超过0.42%。这些结果证实了该方法在实际应用中的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Self-calibration method for spiral CT geometric parameters based on data redundancy conditions.

The geometric parameters of the CT system significantly influence the quality of reconstructed images and the accuracy of dimensional measurements. To achieve precise calibration of these parameters, this study develops a self-calibration method for spiral CT geometry based on data redundancy conditions. Theoretical analysis is conducted to identify the geometric relationships that satisfy data redundancy under spiral scanning trajectories. Using simulation data, we investigate the effects of three key geometric parameters-the source-to-sample distance, the horizontal offset of the detector, and the rotation angle in detector plane-on data redundancy. Additionally, we examine how varying noise levels impact the accuracy of geometric parameter estimation. Finally, the proposed method is validated through spiral CT scanning experiments with real samples. Results show that the calculation accuracy for the detector's horizontal offset is better than 1 pixel, the rotation angle in detector plane accuracy exceeds 0.1°, and the source-to-sample distance accuracy surpasses 0.42%. These findings confirm the effectiveness of the proposed method in practical applications.

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来源期刊
Optics express
Optics express 物理-光学
CiteScore
6.60
自引率
15.80%
发文量
5182
审稿时长
2.1 months
期刊介绍: Optics Express is the all-electronic, open access journal for optics providing rapid publication for peer-reviewed articles that emphasize scientific and technology innovations in all aspects of optics and photonics.
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