{"title":"基于航天器总电离剂量60Co测试的树莓派零W计算指标冗余辐射硬度保证。","authors":"Samuel C Hanson, Robert B Hayes","doi":"10.1097/HP.0000000000001940","DOIUrl":null,"url":null,"abstract":"<p><strong>Abstract: </strong>This work showed the outcome from conducting formal total ionizing dose (TID) testing with a traditional 60Co source on commercial Raspberry Pi computer boards. Two Raspberry Pi boards inside a Gammacell 220 irradiator with continuous biased operations, voltage monitoring, and live computational testing and data extraction were exposed to dose rates of 2.61 ± 0.09 mGy(Si) s-1. The results showed potential tolerance doses approaching 500 Gy(Si). Computational tests included memory, calculation capability, voltage rail output, and I/O. Memory degradation was not observed alongside voltage rail and Input/Output. Individual test result deviations for CPU performance slightly increased in likelihood throughout accumulation of dose. Particular observed weakness included the SD card with potential strengths being use of redundancy and novel spot-shielding opportunities.</p>","PeriodicalId":12976,"journal":{"name":"Health physics","volume":"128 6","pages":"457-466"},"PeriodicalIF":1.4000,"publicationDate":"2025-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radiation Hardness Assurance by Redundancy in Raspberry Pi Zero W Computation Metrics via Total Ionizing Dose 60Co Testing for Spacecraft Applications.\",\"authors\":\"Samuel C Hanson, Robert B Hayes\",\"doi\":\"10.1097/HP.0000000000001940\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><strong>Abstract: </strong>This work showed the outcome from conducting formal total ionizing dose (TID) testing with a traditional 60Co source on commercial Raspberry Pi computer boards. Two Raspberry Pi boards inside a Gammacell 220 irradiator with continuous biased operations, voltage monitoring, and live computational testing and data extraction were exposed to dose rates of 2.61 ± 0.09 mGy(Si) s-1. The results showed potential tolerance doses approaching 500 Gy(Si). Computational tests included memory, calculation capability, voltage rail output, and I/O. Memory degradation was not observed alongside voltage rail and Input/Output. Individual test result deviations for CPU performance slightly increased in likelihood throughout accumulation of dose. Particular observed weakness included the SD card with potential strengths being use of redundancy and novel spot-shielding opportunities.</p>\",\"PeriodicalId\":12976,\"journal\":{\"name\":\"Health physics\",\"volume\":\"128 6\",\"pages\":\"457-466\"},\"PeriodicalIF\":1.4000,\"publicationDate\":\"2025-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Health physics\",\"FirstCategoryId\":\"3\",\"ListUrlMain\":\"https://doi.org/10.1097/HP.0000000000001940\",\"RegionNum\":4,\"RegionCategory\":\"医学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENVIRONMENTAL SCIENCES\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Health physics","FirstCategoryId":"3","ListUrlMain":"https://doi.org/10.1097/HP.0000000000001940","RegionNum":4,"RegionCategory":"医学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENVIRONMENTAL SCIENCES","Score":null,"Total":0}
Radiation Hardness Assurance by Redundancy in Raspberry Pi Zero W Computation Metrics via Total Ionizing Dose 60Co Testing for Spacecraft Applications.
Abstract: This work showed the outcome from conducting formal total ionizing dose (TID) testing with a traditional 60Co source on commercial Raspberry Pi computer boards. Two Raspberry Pi boards inside a Gammacell 220 irradiator with continuous biased operations, voltage monitoring, and live computational testing and data extraction were exposed to dose rates of 2.61 ± 0.09 mGy(Si) s-1. The results showed potential tolerance doses approaching 500 Gy(Si). Computational tests included memory, calculation capability, voltage rail output, and I/O. Memory degradation was not observed alongside voltage rail and Input/Output. Individual test result deviations for CPU performance slightly increased in likelihood throughout accumulation of dose. Particular observed weakness included the SD card with potential strengths being use of redundancy and novel spot-shielding opportunities.
期刊介绍：
Health Physics, first published in 1958, provides the latest research to a wide variety of radiation safety professionals including health physicists, nuclear chemists, medical physicists, and radiation safety officers with interests in nuclear and radiation science. The Journal allows professionals in these and other disciplines in science and engineering to stay on the cutting edge of scientific and technological advances in the field of radiation safety. The Journal publishes original papers, technical notes, articles on advances in practical applications, editorials, and correspondence. Journal articles report on the latest findings in theoretical, practical, and applied disciplines of epidemiology and radiation effects, radiation biology and radiation science, radiation ecology, and related fields.
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