Chenchen Ye,Jiakang Li,Peiyan Hong,Jiaming Zhao,Xiangshui Miao,Xuefei Li
{"title":"高性能原子层沉积双栅InGaO薄膜晶体管。","authors":"Chenchen Ye,Jiakang Li,Peiyan Hong,Jiaming Zhao,Xiangshui Miao,Xuefei Li","doi":"10.1021/acs.nanolett.5c01059","DOIUrl":null,"url":null,"abstract":"Amorphous oxide semiconductors (AOSs) have attracted considerable attention because of their high carrier density, low thermal budget, and large bandgap. However, the high electron density in AOSs hinders their ability to turn off effectively, resulting in a trade-off between the threshold voltage (Vth) and mobility (μ). In this work, we report high-performance dual-gate (DG) indium gallium oxide (IGO) TFTs utilizing localized O3 treatment to effectively passivate the oxygen vacancies (Vo) in the channel region of IGO TFTs, thereby achieving a positive Vth and high mobility. The 100 nm short-channel length (Lch) enhancement-mode IGO DG TFT exhibits an ideal subthreshold slope (SS) of 63 mV/dec, a maximum drain current IDS of 1.36 mA/μm, and a record high transconductance (gm) of 1008 μS/μm. This study demonstrates a novel method to overcome the trade-off between Vth and μ, showing that IGO DG-TFTs are promising transistors for enabling high-performance monolithic three-dimensional (M3D) integrated circuits.","PeriodicalId":53,"journal":{"name":"Nano Letters","volume":"36 1","pages":""},"PeriodicalIF":9.1000,"publicationDate":"2025-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-Performance Atomic-Layer-Deposited Dual-Gate InGaO Thin-Film Transistors.\",\"authors\":\"Chenchen Ye,Jiakang Li,Peiyan Hong,Jiaming Zhao,Xiangshui Miao,Xuefei Li\",\"doi\":\"10.1021/acs.nanolett.5c01059\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Amorphous oxide semiconductors (AOSs) have attracted considerable attention because of their high carrier density, low thermal budget, and large bandgap. However, the high electron density in AOSs hinders their ability to turn off effectively, resulting in a trade-off between the threshold voltage (Vth) and mobility (μ). In this work, we report high-performance dual-gate (DG) indium gallium oxide (IGO) TFTs utilizing localized O3 treatment to effectively passivate the oxygen vacancies (Vo) in the channel region of IGO TFTs, thereby achieving a positive Vth and high mobility. The 100 nm short-channel length (Lch) enhancement-mode IGO DG TFT exhibits an ideal subthreshold slope (SS) of 63 mV/dec, a maximum drain current IDS of 1.36 mA/μm, and a record high transconductance (gm) of 1008 μS/μm. This study demonstrates a novel method to overcome the trade-off between Vth and μ, showing that IGO DG-TFTs are promising transistors for enabling high-performance monolithic three-dimensional (M3D) integrated circuits.\",\"PeriodicalId\":53,\"journal\":{\"name\":\"Nano Letters\",\"volume\":\"36 1\",\"pages\":\"\"},\"PeriodicalIF\":9.1000,\"publicationDate\":\"2025-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nano Letters\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1021/acs.nanolett.5c01059\",\"RegionNum\":1,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"CHEMISTRY, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nano Letters","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1021/acs.nanolett.5c01059","RegionNum":1,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
Amorphous oxide semiconductors (AOSs) have attracted considerable attention because of their high carrier density, low thermal budget, and large bandgap. However, the high electron density in AOSs hinders their ability to turn off effectively, resulting in a trade-off between the threshold voltage (Vth) and mobility (μ). In this work, we report high-performance dual-gate (DG) indium gallium oxide (IGO) TFTs utilizing localized O3 treatment to effectively passivate the oxygen vacancies (Vo) in the channel region of IGO TFTs, thereby achieving a positive Vth and high mobility. The 100 nm short-channel length (Lch) enhancement-mode IGO DG TFT exhibits an ideal subthreshold slope (SS) of 63 mV/dec, a maximum drain current IDS of 1.36 mA/μm, and a record high transconductance (gm) of 1008 μS/μm. This study demonstrates a novel method to overcome the trade-off between Vth and μ, showing that IGO DG-TFTs are promising transistors for enabling high-performance monolithic three-dimensional (M3D) integrated circuits.
期刊介绍:
Nano Letters serves as a dynamic platform for promptly disseminating original results in fundamental, applied, and emerging research across all facets of nanoscience and nanotechnology. A pivotal criterion for inclusion within Nano Letters is the convergence of at least two different areas or disciplines, ensuring a rich interdisciplinary scope. The journal is dedicated to fostering exploration in diverse areas, including:
- Experimental and theoretical findings on physical, chemical, and biological phenomena at the nanoscale
- Synthesis, characterization, and processing of organic, inorganic, polymer, and hybrid nanomaterials through physical, chemical, and biological methodologies
- Modeling and simulation of synthetic, assembly, and interaction processes
- Realization of integrated nanostructures and nano-engineered devices exhibiting advanced performance
- Applications of nanoscale materials in living and environmental systems
Nano Letters is committed to advancing and showcasing groundbreaking research that intersects various domains, fostering innovation and collaboration in the ever-evolving field of nanoscience and nanotechnology.