一种新型分布式衰减器,采用dtmos与rb和二极管连接的基于fet的压敏电阻

0 ENGINEERING, ELECTRICAL & ELECTRONIC
Jhin-Sheng Huang;Yo-Sheng Lin
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引用次数: 0

摘要

提出了一种高线性度、宽衰减范围的无源分布式衰减器。它由四个并联压敏电阻单元和三段串联$\lambda $ /8-传输线(TL)为基础的$\lambda $ /6和50- $\Omega $合成TLs组成。每个压敏电阻单元由dtmos - ${R} _{\text {B}}$ FET (DFET) M1/M2级联组成,并与DFET M3级联和二极管连接的FET M4级联,然后与TL2串联用于寄生电容的相位补偿。在低衰减状态(${V} _{\text {ct}} =0$ V)下,由于M1/M2的级联编码和${R} _{\text {B}}$的泄漏抑制,M1导通速度减慢,从而获得输入1db压缩点(IP1dB)的提升。在高衰减状态(${V} _{\text {ct}} =2$ V)下,由于压敏电阻单元相当于$70~\Omega $的并联电阻(R),在${V} _{\text {in}}$为- 4至4 V时,可以实现低增益扩展(${P} _{\text {in}}$至20 dBm小于1 dB)。这是由于M3/M4级联码在${V} _{\text {in}}$处提供了第二条大于${V} _{\text {ct}} - {V}_{\text {th}}$ (1.7 V)的传导路径,M2从低R线性区进入高R饱和区。该衰减器实现了20 dBm的IP1dB,att (${P} _{\text {in}}$在1 db衰减范围减小时),是迄今为止报道的(Bi)CMOS衰减器中最好的IP1dB,att结果之一。对于4位衰减控制(- 4至- 19 dB), 1 dB/步长,衰减器在37-41 GHz时实现了0.01-0.5 dB的均方根增益误差和4.5°-5.9°的均方根相位误差。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A New Distributed Attenuator Using DTMOS-With-RB- and Diode-Connected-FET-Based Varistor Units
A passive distributed attenuator with high linearity and a wide attenuation range is presented. It consists of four parallel varistor units and three sections of series $\lambda $ /8-transmission line (TL)-based $\lambda $ /6 and 50- $\Omega $ synthetic TLs. Each varistor unit consists of a cascode of DTMOS-with- ${R} _{\text {B}}$ FETs (DFET) M1/M2 in parallel with a cascode of DFET M3 and diode-connected FET M4 and then in series with TL2 for phase compensation of parasitic capacitance. In the low-attenuation state ( ${V} _{\text {ct}} =0$ V), input 1-dB compression point (IP1dB) boosting is attained due to the cascode of M1/M2 and the slowdown of M1 turn-on by the leakage suppression of ${R} _{\text {B}}$ . In the high-attenuation state ( ${V} _{\text {ct}} =2$ V), low gain expansion (smaller than 1 dB for ${P} _{\text {in}}$ up to 20 dBm) is achieved since the varistor unit is equivalent to a parallel resistance (R) of $70~\Omega $ for ${V} _{\text {in}}$ of −4 to 4 V. This is attributed to the cascode of M3/M4 providing a second conduction path at ${V} _{\text {in}}$ that is larger than ${V} _{\text {ct}} - {V}_{\text {th}}$ (1.7 V), where M2 enters the high R saturation region from the low R linear region. The attenuator achieves IP1dB,att ( ${P} _{\text {in}}$ at 1-dB attenuation range reduction) of 20 dBm, one of the best IP1dB,att results ever reported for (Bi)CMOS attenuators. For 4-bit attenuation control (−4 to −19 dB) with 1 dB/step, the attenuator achieves an rms gain error of 0.01–0.5 dB and an rms phase error of 4.5°–5.9° for 37–41 GHz.
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