Szymon Winczewski*, Jacek Dziedzic, Marcin Łapiński and Jarosław Rybicki,
{"title":"真实模拟气相沉积薄膜的新方法及其在晶体硅上金薄膜生长研究中的应用","authors":"Szymon Winczewski*, Jacek Dziedzic, Marcin Łapiński and Jarosław Rybicki, ","doi":"10.1021/acs.jctc.5c0031910.1021/acs.jctc.5c00319","DOIUrl":null,"url":null,"abstract":"<p >We present a novel approach for simulating thin film (TF) deposition from the gas phase at the atomistic scale, combining molecular dynamics (MD) and time-stamped force-bias Monte Carlo (tfMC). In this approach, MD, with its fine temporal resolution, captures fast events, such as incident atom-substrate collisions, while tfMC simulates slow relaxation processes, enhancing temporal scale coverage. The proposed approach also adequately models deposition conditions, for example, by accounting for realistic energy and angle distributions in the description of the incident flux. To demonstrate its efficacy, we apply it to simulate the physical vapor deposition of a 3 nm Au TF on crystalline Si. We find that the entire deposition process consisted of four distinct stages: (i) the initial degradation of the Si substrate, (ii) formation of a mixed Au–Si interface layer, (iii) nucleation and growth of a polycrystalline Au layer, proceeding in a fashion close to the Frank-van der Merwe mode (layer-by-layer growth), and (iv) postdeposition relaxation of microstructure. The produced TF was comprehensively characterized, revealing that the deposited polycrystalline Au layer contained a considerable number of defects, including dislocations, stacking faults, grain boundaries, and Si impurities. The analysis also showed that in the simulated high-energy deposition the Si substrate was considerably degraded and that the disordered Au–Si layer which formed at the interface resembled the melt-quenched Au<sub>82</sub>Si<sub>18</sub> eutectic. A comparison with an analogous MD simulation revealed that the MD + tfMC approach extended the accessible time scale 5-fold, allowing us to reach the microsecond scale, and yielding a TF with higher crystallinity and better-developed microstructure. The deposition rate used in the MD + tfMC simulation was two to 3 orders of magnitude lower than in other recent, but purely MD, simulations, being significantly closer to experiment.</p>","PeriodicalId":45,"journal":{"name":"Journal of Chemical Theory and Computation","volume":"21 9","pages":"4792–4814 4792–4814"},"PeriodicalIF":5.5000,"publicationDate":"2025-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.acs.org/doi/epdf/10.1021/acs.jctc.5c00319","citationCount":"0","resultStr":"{\"title\":\"Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon\",\"authors\":\"Szymon Winczewski*, Jacek Dziedzic, Marcin Łapiński and Jarosław Rybicki, \",\"doi\":\"10.1021/acs.jctc.5c0031910.1021/acs.jctc.5c00319\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p >We present a novel approach for simulating thin film (TF) deposition from the gas phase at the atomistic scale, combining molecular dynamics (MD) and time-stamped force-bias Monte Carlo (tfMC). In this approach, MD, with its fine temporal resolution, captures fast events, such as incident atom-substrate collisions, while tfMC simulates slow relaxation processes, enhancing temporal scale coverage. The proposed approach also adequately models deposition conditions, for example, by accounting for realistic energy and angle distributions in the description of the incident flux. To demonstrate its efficacy, we apply it to simulate the physical vapor deposition of a 3 nm Au TF on crystalline Si. We find that the entire deposition process consisted of four distinct stages: (i) the initial degradation of the Si substrate, (ii) formation of a mixed Au–Si interface layer, (iii) nucleation and growth of a polycrystalline Au layer, proceeding in a fashion close to the Frank-van der Merwe mode (layer-by-layer growth), and (iv) postdeposition relaxation of microstructure. The produced TF was comprehensively characterized, revealing that the deposited polycrystalline Au layer contained a considerable number of defects, including dislocations, stacking faults, grain boundaries, and Si impurities. The analysis also showed that in the simulated high-energy deposition the Si substrate was considerably degraded and that the disordered Au–Si layer which formed at the interface resembled the melt-quenched Au<sub>82</sub>Si<sub>18</sub> eutectic. A comparison with an analogous MD simulation revealed that the MD + tfMC approach extended the accessible time scale 5-fold, allowing us to reach the microsecond scale, and yielding a TF with higher crystallinity and better-developed microstructure. The deposition rate used in the MD + tfMC simulation was two to 3 orders of magnitude lower than in other recent, but purely MD, simulations, being significantly closer to experiment.</p>\",\"PeriodicalId\":45,\"journal\":{\"name\":\"Journal of Chemical Theory and Computation\",\"volume\":\"21 9\",\"pages\":\"4792–4814 4792–4814\"},\"PeriodicalIF\":5.5000,\"publicationDate\":\"2025-04-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://pubs.acs.org/doi/epdf/10.1021/acs.jctc.5c00319\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Chemical Theory and Computation\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://pubs.acs.org/doi/10.1021/acs.jctc.5c00319\",\"RegionNum\":1,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Chemical Theory and Computation","FirstCategoryId":"92","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acs.jctc.5c00319","RegionNum":1,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
摘要
我们提出了一种在原子尺度上从气相模拟薄膜(TF)沉积的新方法,该方法结合了分子动力学(MD)和时间戳力偏性蒙特卡罗(tfMC)。在这种方法中,MD具有良好的时间分辨率,可以捕获快速事件,例如事件原子-衬底碰撞,而tfMC模拟缓慢的弛豫过程,增强时间尺度覆盖。所提出的方法还充分模拟了沉积条件,例如,在入射通量的描述中考虑了实际的能量和角度分布。为了证明其有效性,我们将其应用于模拟3nm Au TF在晶体Si上的物理气相沉积。我们发现整个沉积过程由四个不同的阶段组成:(i) Si衬底的初始降解,(ii)混合Au - Si界面层的形成,(iii)多晶Au层的成核和生长,以接近Frank-van der Merwe模式(逐层生长)的方式进行,以及(iv)沉积后微观结构的松弛。对制备的TF进行了综合表征,发现沉积的多晶Au层含有相当数量的缺陷,包括位错、层错、晶界和Si杂质。分析还表明,在模拟高能沉积中,Si衬底明显降解,在界面处形成无序的Au-Si层,类似于熔体淬火的Au82Si18共晶。与类似的MD模拟比较表明,MD + tfMC方法将可访问的时间尺度延长了5倍,使我们能够达到微秒尺度,并产生具有更高结晶度和更发达的微观结构的TF。MD + tfMC模拟中使用的沉积速率比近期其他纯MD模拟低2 ~ 3个数量级,但与实验结果明显接近。
Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon
We present a novel approach for simulating thin film (TF) deposition from the gas phase at the atomistic scale, combining molecular dynamics (MD) and time-stamped force-bias Monte Carlo (tfMC). In this approach, MD, with its fine temporal resolution, captures fast events, such as incident atom-substrate collisions, while tfMC simulates slow relaxation processes, enhancing temporal scale coverage. The proposed approach also adequately models deposition conditions, for example, by accounting for realistic energy and angle distributions in the description of the incident flux. To demonstrate its efficacy, we apply it to simulate the physical vapor deposition of a 3 nm Au TF on crystalline Si. We find that the entire deposition process consisted of four distinct stages: (i) the initial degradation of the Si substrate, (ii) formation of a mixed Au–Si interface layer, (iii) nucleation and growth of a polycrystalline Au layer, proceeding in a fashion close to the Frank-van der Merwe mode (layer-by-layer growth), and (iv) postdeposition relaxation of microstructure. The produced TF was comprehensively characterized, revealing that the deposited polycrystalline Au layer contained a considerable number of defects, including dislocations, stacking faults, grain boundaries, and Si impurities. The analysis also showed that in the simulated high-energy deposition the Si substrate was considerably degraded and that the disordered Au–Si layer which formed at the interface resembled the melt-quenched Au82Si18 eutectic. A comparison with an analogous MD simulation revealed that the MD + tfMC approach extended the accessible time scale 5-fold, allowing us to reach the microsecond scale, and yielding a TF with higher crystallinity and better-developed microstructure. The deposition rate used in the MD + tfMC simulation was two to 3 orders of magnitude lower than in other recent, but purely MD, simulations, being significantly closer to experiment.
期刊介绍:
The Journal of Chemical Theory and Computation invites new and original contributions with the understanding that, if accepted, they will not be published elsewhere. Papers reporting new theories, methodology, and/or important applications in quantum electronic structure, molecular dynamics, and statistical mechanics are appropriate for submission to this Journal. Specific topics include advances in or applications of ab initio quantum mechanics, density functional theory, design and properties of new materials, surface science, Monte Carlo simulations, solvation models, QM/MM calculations, biomolecular structure prediction, and molecular dynamics in the broadest sense including gas-phase dynamics, ab initio dynamics, biomolecular dynamics, and protein folding. The Journal does not consider papers that are straightforward applications of known methods including DFT and molecular dynamics. The Journal favors submissions that include advances in theory or methodology with applications to compelling problems.