Wenyu Hu, Jie Jiang, Xinru Han, Hangyu Yin, Zijun Yan, Xiaoyi Wang*, Yang Qiu* and Gan Wang*,
{"title":"Bi2Te3-FeTe薄膜中界面反应相关样品质量和超导性","authors":"Wenyu Hu, Jie Jiang, Xinru Han, Hangyu Yin, Zijun Yan, Xiaoyi Wang*, Yang Qiu* and Gan Wang*, ","doi":"10.1021/acsaelm.5c0058810.1021/acsaelm.5c00588","DOIUrl":null,"url":null,"abstract":"<p >The realization of atomic arrangement at the van der Waals interface is of importance in the exploration of interfacial superconductivity. Here, by epitaxy of Bi<sub>2</sub>Te<sub>3</sub>/FeTe heterostructures with different interface qualities, the corresponding atomic images and electron energy loss spectra evidence the relationship between interfacial chemical reaction and interface quality. Interfacial chemical reaction will cause the stoichiometric ratio imbalance of the FeTe layer and produce a large number of interstitial iron-related defects. When FeTe is employed as the growth substrate, it is crucial to maintain stable growth parameters for the Bi<sub>2</sub>Te<sub>3</sub> layer. Conversely, when the Bi<sub>2</sub>Te<sub>3</sub> layer serves as the growth substrate, ensuring a balanced stoichiometric ratio within the Bi<sub>2</sub>Te<sub>3</sub> layer becomes paramount. This approach minimizes the extent of interface reactions and guarantees the stable presence of the superconducting phase at the interface. This work provides insights into the underlying relationship between interface structure and superconductivity in Bi<sub>2</sub>Te<sub>3</sub>/FeTe, and it reveals the possible mechanism by which neighboring telluride layers affect the topological superconductivity of FeTe heterostructures.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"7 9","pages":"4382–4390 4382–4390"},"PeriodicalIF":4.3000,"publicationDate":"2025-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Interfacial Reaction-Associated Sample Quality and Superconductivity in Bi2Te3–FeTe Thin Films\",\"authors\":\"Wenyu Hu, Jie Jiang, Xinru Han, Hangyu Yin, Zijun Yan, Xiaoyi Wang*, Yang Qiu* and Gan Wang*, \",\"doi\":\"10.1021/acsaelm.5c0058810.1021/acsaelm.5c00588\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p >The realization of atomic arrangement at the van der Waals interface is of importance in the exploration of interfacial superconductivity. Here, by epitaxy of Bi<sub>2</sub>Te<sub>3</sub>/FeTe heterostructures with different interface qualities, the corresponding atomic images and electron energy loss spectra evidence the relationship between interfacial chemical reaction and interface quality. Interfacial chemical reaction will cause the stoichiometric ratio imbalance of the FeTe layer and produce a large number of interstitial iron-related defects. When FeTe is employed as the growth substrate, it is crucial to maintain stable growth parameters for the Bi<sub>2</sub>Te<sub>3</sub> layer. Conversely, when the Bi<sub>2</sub>Te<sub>3</sub> layer serves as the growth substrate, ensuring a balanced stoichiometric ratio within the Bi<sub>2</sub>Te<sub>3</sub> layer becomes paramount. This approach minimizes the extent of interface reactions and guarantees the stable presence of the superconducting phase at the interface. This work provides insights into the underlying relationship between interface structure and superconductivity in Bi<sub>2</sub>Te<sub>3</sub>/FeTe, and it reveals the possible mechanism by which neighboring telluride layers affect the topological superconductivity of FeTe heterostructures.</p>\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":\"7 9\",\"pages\":\"4382–4390 4382–4390\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2025-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://pubs.acs.org/doi/10.1021/acsaelm.5c00588\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acsaelm.5c00588","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Interfacial Reaction-Associated Sample Quality and Superconductivity in Bi2Te3–FeTe Thin Films
The realization of atomic arrangement at the van der Waals interface is of importance in the exploration of interfacial superconductivity. Here, by epitaxy of Bi2Te3/FeTe heterostructures with different interface qualities, the corresponding atomic images and electron energy loss spectra evidence the relationship between interfacial chemical reaction and interface quality. Interfacial chemical reaction will cause the stoichiometric ratio imbalance of the FeTe layer and produce a large number of interstitial iron-related defects. When FeTe is employed as the growth substrate, it is crucial to maintain stable growth parameters for the Bi2Te3 layer. Conversely, when the Bi2Te3 layer serves as the growth substrate, ensuring a balanced stoichiometric ratio within the Bi2Te3 layer becomes paramount. This approach minimizes the extent of interface reactions and guarantees the stable presence of the superconducting phase at the interface. This work provides insights into the underlying relationship between interface structure and superconductivity in Bi2Te3/FeTe, and it reveals the possible mechanism by which neighboring telluride layers affect the topological superconductivity of FeTe heterostructures.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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