{"title":"基于mos2的单层原子电阻的SET扫描阻性开关模型及其密度泛函理论模拟","authors":"Aykut Turfanda*, and , Alessio Gagliardi*, ","doi":"10.1021/acsaelm.5c0006110.1021/acsaelm.5c00061","DOIUrl":null,"url":null,"abstract":"<p >We study the atomistic origins of resistive switching in atomristors through a single-layer MoS<sub>2</sub> and the Au(111) surface’s slab model. We aim to understand the main working mechanism and the physical phenomena governing these atomically thin resistive switching devices. For this, we use analytical models together with density functional theory simulations in a symbiotic relationship to explain the SET process and hysteresis. We found that our calculations with neutral and charged S-vacancy and with neutral and charged Au dopants may reveal the complex interface dynamics of atomristors. We conclude that a reversible breakdown mechanism occurs for SET, which is preceded by the degradation of single-layer MoS<sub>2</sub> during synthesis. Understanding the mechanism will allow us to fine-tune this low-energy consumption atomically thin resistive switching device to fulfill the necessities of neuromorphic computing better.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"7 9","pages":"3795–3809 3795–3809"},"PeriodicalIF":4.3000,"publicationDate":"2025-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.acs.org/doi/epdf/10.1021/acsaelm.5c00061","citationCount":"0","resultStr":"{\"title\":\"Single-Layer MoS2-Based Atomristor’s Resistive Switching Model for SET Sweep with Density Functional Theory Simulations\",\"authors\":\"Aykut Turfanda*, and , Alessio Gagliardi*, \",\"doi\":\"10.1021/acsaelm.5c0006110.1021/acsaelm.5c00061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p >We study the atomistic origins of resistive switching in atomristors through a single-layer MoS<sub>2</sub> and the Au(111) surface’s slab model. We aim to understand the main working mechanism and the physical phenomena governing these atomically thin resistive switching devices. For this, we use analytical models together with density functional theory simulations in a symbiotic relationship to explain the SET process and hysteresis. We found that our calculations with neutral and charged S-vacancy and with neutral and charged Au dopants may reveal the complex interface dynamics of atomristors. We conclude that a reversible breakdown mechanism occurs for SET, which is preceded by the degradation of single-layer MoS<sub>2</sub> during synthesis. Understanding the mechanism will allow us to fine-tune this low-energy consumption atomically thin resistive switching device to fulfill the necessities of neuromorphic computing better.</p>\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":\"7 9\",\"pages\":\"3795–3809 3795–3809\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2025-04-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://pubs.acs.org/doi/epdf/10.1021/acsaelm.5c00061\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://pubs.acs.org/doi/10.1021/acsaelm.5c00061\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acsaelm.5c00061","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Single-Layer MoS2-Based Atomristor’s Resistive Switching Model for SET Sweep with Density Functional Theory Simulations
We study the atomistic origins of resistive switching in atomristors through a single-layer MoS2 and the Au(111) surface’s slab model. We aim to understand the main working mechanism and the physical phenomena governing these atomically thin resistive switching devices. For this, we use analytical models together with density functional theory simulations in a symbiotic relationship to explain the SET process and hysteresis. We found that our calculations with neutral and charged S-vacancy and with neutral and charged Au dopants may reveal the complex interface dynamics of atomristors. We conclude that a reversible breakdown mechanism occurs for SET, which is preceded by the degradation of single-layer MoS2 during synthesis. Understanding the mechanism will allow us to fine-tune this low-energy consumption atomically thin resistive switching device to fulfill the necessities of neuromorphic computing better.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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