洞察石墨烯-铜导体:评估电导率增强和测量挑战

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Pouria Khanbolouki, Raju Ghimire, Ivana Matanovic, Chao Wang and Mehran Tehrani*, 
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引用次数: 0

摘要

将石墨烯(Gr)掺入铜(Cu)中以提高其电性能已成为微电子、电磁屏蔽和电动机等应用的研究热点。本文的目的是复制最近的研究报告的样品和结果,“超导”的铬铜样品。此外,它还确定了金属薄膜和细线电导率测量的潜在误差来源,这些金属薄膜和细线通常用作Gr-Cu研究中的测试样品。结果表明,在低于300 K范围内,添加Gr仅能略微提高Gr - cu试样的电导率。然而,在300-400 K范围内,与参考样品相比,其电阻温度系数(TCR)降低了约3%。本研究还通过环境和高温下的原子模拟研究了导电机制和电导率,测试了几种功能,以确定建模Gr/Cu混合体系的最准确方法。密度泛函理论(DFT)计算证实,电子结构的变化──由Cu到Gr的强电子转移引起的──不会显著增加电导率,这与普遍的看法相反。相反,边际实验增加主要归因于Cu微观结构的改变,而不是石墨烯掺入的实质性改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Insights into Graphene-Copper Conductors: Evaluating Conductivity Enhancement and Measurement Challenges

Insights into Graphene-Copper Conductors: Evaluating Conductivity Enhancement and Measurement Challenges

Incorporating graphene (Gr) into copper (Cu) to enhance its electrical properties has become a focal point of research for applications such as microelectronics, electromagnetic shielding, and electric motors. This paper aims to replicate the samples and results from recent studies that reported “ultraconductivity” in Gr–Cu specimens. Moreover, it identifies potential sources of error in conductivity measurements for thin metal films and fine wires, commonly used as test samples in Gr–Cu research. The findings indicate that adding Gr only marginally improves the conductivity of Gr–Cu specimens in the sub-300 K range. However, it reduces their temperature coefficient of resistance (TCR) by about 3% in the 300–400 K range compared with reference samples. This study also investigates conduction mechanisms and electrical conductivity through atomistic simulations at ambient and elevated temperatures, testing several functionals to determine the most accurate approach for modeling the Gr/Cu hybrid system. Density functional theory (DFT) calculations confirm that changes in the electronic structure─arising from strong electron transfer from Cu to Gr, do not significantly increase electrical conductivity, contrary to popular belief. Instead, the marginal experimental increases are primarily attributed to alterations in the Cu microstructure rather than substantial improvements due to graphene incorporation.

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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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