{"title":"应用于非线性铁氧体传输线绝缘的微波范围有机硅化合物复介电常数的测量","authors":"P. V. Priputnev, A. I. Klimov, D. S. Kokin","doi":"10.1007/s11182-025-03430-2","DOIUrl":null,"url":null,"abstract":"<div><p>The complex dielectric permittivity of silicon compounds is measured in the microwave range. The measurement is carried out using a method based on determining half-wave resonances in a coaxial line filled with a dielectric with unknown properties. Based on the measurements obtained, the excitation of high-frequency oscillations in a nonlinear transmission line with saturated ferrite with high-voltage insulation in the form of a silicon compound is simulated numerically. The complex permittivity dependence on frequency is described by the Lorentz model.</p></div>","PeriodicalId":770,"journal":{"name":"Russian Physics Journal","volume":"68 2","pages":"282 - 287"},"PeriodicalIF":0.4000,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measurement of complex dielectric permittivity of organosilicon compounds in the microwave range for application as insulation in nonlinear transmission lines with ferrite\",\"authors\":\"P. V. Priputnev, A. I. Klimov, D. S. Kokin\",\"doi\":\"10.1007/s11182-025-03430-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The complex dielectric permittivity of silicon compounds is measured in the microwave range. The measurement is carried out using a method based on determining half-wave resonances in a coaxial line filled with a dielectric with unknown properties. Based on the measurements obtained, the excitation of high-frequency oscillations in a nonlinear transmission line with saturated ferrite with high-voltage insulation in the form of a silicon compound is simulated numerically. The complex permittivity dependence on frequency is described by the Lorentz model.</p></div>\",\"PeriodicalId\":770,\"journal\":{\"name\":\"Russian Physics Journal\",\"volume\":\"68 2\",\"pages\":\"282 - 287\"},\"PeriodicalIF\":0.4000,\"publicationDate\":\"2025-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Russian Physics Journal\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s11182-025-03430-2\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Russian Physics Journal","FirstCategoryId":"101","ListUrlMain":"https://link.springer.com/article/10.1007/s11182-025-03430-2","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, MULTIDISCIPLINARY","Score":null,"Total":0}
Measurement of complex dielectric permittivity of organosilicon compounds in the microwave range for application as insulation in nonlinear transmission lines with ferrite
The complex dielectric permittivity of silicon compounds is measured in the microwave range. The measurement is carried out using a method based on determining half-wave resonances in a coaxial line filled with a dielectric with unknown properties. Based on the measurements obtained, the excitation of high-frequency oscillations in a nonlinear transmission line with saturated ferrite with high-voltage insulation in the form of a silicon compound is simulated numerically. The complex permittivity dependence on frequency is described by the Lorentz model.
期刊介绍:
Russian Physics Journal covers the broad spectrum of specialized research in applied physics, with emphasis on work with practical applications in solid-state physics, optics, and magnetism. Particularly interesting results are reported in connection with: electroluminescence and crystal phospors; semiconductors; phase transformations in solids; superconductivity; properties of thin films; and magnetomechanical phenomena.