基于全波谱域法的含垂直金属夹杂人工介质层的高效分析方法

IF 4.6 1区计算机科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Antennas and Propagation Pub Date : 2025-01-20 DOI:10.1109/TAP.2025.3529189

Alexander J. van Katwijk;Andrea Neto;Daniele Cavallo

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引用次数: 0

摘要

我们提出了一种有效的方法来分析由垂直金属引脚连接的两个人工介电层（adl）组成的周期性引脚补片结构。adl由周期性晶格中的方形金属片制成，最近被用作天线和阵列的上覆层，以增强带宽和扫描范围。adl形成了一种各向异性的有效介质，因此可以在不支持表面波的情况下实现大的扫描体积。然而，各向异性增加了天线在对角线面上的交叉极化（X-pol）。通过在ADL上覆层中引入垂直金属引脚，形成引脚贴片结构，可以减少这一问题。该分析方法基于谱矩法，采用笛卡尔和圆柱混合表示的全域基函数，准确地模拟了一般平面波入射下电流对结构和散射参数的影响。

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An Efficient Analysis Method for Artificial Dielectric Layers With Vertical Metal Inclusions Based on a Full-Wave Spectral-Domain Approach

We present an efficient method to analyze a periodic pin-patch structure, consisting of two artificial dielectric layers (ADLs) connected by vertical metal pins. ADLs are made of square metal patches in a periodic lattice and have recently been used as superstrates in antennas and arrays to enhance the bandwidth and scanning range. ADLs form an anisotropic effective medium, thus enabling a large scanning volume without supporting surface waves. However, the anisotropy increases the cross-polarization (X-pol) of the antenna in the diagonal plane. This problem can be reduced by introducing vertical metal pins in the ADL superstrate to form the pin-patch structure. The analysis method is based on a spectral method of moments (MoMs) and uses entire-domain basis functions in a hybrid Cartesian and cylindrical representation to accurately model the currents on the structure and scattering parameters under general plane-wave incidence.

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来源期刊

IEEE Transactions on Antennas and Propagation 工程技术-电信学

CiteScore

10.40

自引率

28.10%

发文量

968

审稿时长

4.7 months

期刊介绍： IEEE Transactions on Antennas and Propagation includes theoretical and experimental advances in antennas, including design and development, and in the propagation of electromagnetic waves, including scattering, diffraction, and interaction with continuous media; and applications pertaining to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques