Natalia A. Gutierrez Andrade, Yunfeng Nie, Wendy Meulebroeck, Heidi Ottevaere
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Surface plasmon resonance sensor tailored to detect dielectric constants within the range of synthetic polymers
Plastic pollution poses a significant environmental concern; however, current methods for identifying and characterising synthetic polymers often require time-consuming procedures or rely on sample degradation. This study demonstrates the direct detection of a broad range of synthetic polymers using Surface Plasmon Resonance (SPR). By tailoring the prism design in the Kretschmann configuration, we extended the dynamic refractive index range of the sensor to encompass typical polymer refractive indices (∼1.49–1.58). Initial validation with refractive index oils confirmed the prism’s ability to detect materials within this range. Subsequently, SPR curves were obtained for nine different polymers, each exhibiting distinctive resonance shifts that may enable polymer-specific identification. Notably, these results also demonstrate SPR’s capability to detect pigmented materials, which is often challenging using other techniques. This direct detection strategy avoids the need for complex spectra analysis procedures, thereby improving measurement efficiency. Finally, we present the potential integration of SPR imaging to explore additional parameters of plastic pollution, paving the way for more comprehensive environmental monitoring and assessment. Our approach holds promise for advancing polymer analysis with SPR by decreasing the analysis time using a direct detection method and expanding the range of materials that can be analysed.
期刊介绍:
Sensors and Actuators A: Physical brings together multidisciplinary interests in one journal entirely devoted to disseminating information on all aspects of research and development of solid-state devices for transducing physical signals. Sensors and Actuators A: Physical regularly publishes original papers, letters to the Editors and from time to time invited review articles within the following device areas:
• Fundamentals and Physics, such as: classification of effects, physical effects, measurement theory, modelling of sensors, measurement standards, measurement errors, units and constants, time and frequency measurement. Modeling papers should bring new modeling techniques to the field and be supported by experimental results.
• Materials and their Processing, such as: piezoelectric materials, polymers, metal oxides, III-V and II-VI semiconductors, thick and thin films, optical glass fibres, amorphous, polycrystalline and monocrystalline silicon.
• Optoelectronic sensors, such as: photovoltaic diodes, photoconductors, photodiodes, phototransistors, positron-sensitive photodetectors, optoisolators, photodiode arrays, charge-coupled devices, light-emitting diodes, injection lasers and liquid-crystal displays.
• Mechanical sensors, such as: metallic, thin-film and semiconductor strain gauges, diffused silicon pressure sensors, silicon accelerometers, solid-state displacement transducers, piezo junction devices, piezoelectric field-effect transducers (PiFETs), tunnel-diode strain sensors, surface acoustic wave devices, silicon micromechanical switches, solid-state flow meters and electronic flow controllers.
Etc...