基于快速淬火和Pr取代的协同效应改善铋铁氧体陶瓷的电学性能

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Wei Cai, Zhiqiang Liu, Wei Wang, Xiuqi Li, Jiali Tang, Gang Chen, Rongli Gao, Xiaoling Deng, Chunlin Fu
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引用次数: 0

摘要

BiFeO3 (BFO)作为一种很有前途的无铅铁电材料,由于其独特的电学性能和在传感器和存储器件中的潜在应用而备受关注。然而,BFO陶瓷的高泄漏电流和难以获得纯相仍然极大地限制了其实际应用。在此,在A位引入Pr3+和快速淬火协同作用,获得了单相Bi1−xPrxFeO3陶瓷,并改善了其电学性能。系统研究了Pr3+对Bi1−xPrxFeO3陶瓷微观结构、介电性能和铁电性能的影响。结果表明:快速淬火法制备的Bi1−xPrxFeO3 (x = 0 ~ 0.075)陶瓷以菱形体相为主,Pr3+的引入显著抑制了杂质相的形成;更稳定的Pr3+部分取代Bi3+不仅细化了Bi1−xPrxFeO3陶瓷的晶粒尺寸,而且显著降低了其漏电流密度。此外,Pr3+的引入也导致BiFeO3陶瓷的残余极化增加。快速淬火与Pr3 +掺杂的协同效应对改善BiFeO3陶瓷的电学性能起着至关重要的作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Improved electrical properties of bismuth ferrite ceramics based on the synergistic effect of a rapid quenching method and Pr substitution

BiFeO3 (BFO) as a promising lead-free ferroelectric material has attracted significant attention due to its unique electrical properties and potential applications in sensors and memory devices. However, the high leakage current and difficulty in obtaining a pure phase for BFO ceramics still significantly limit its practical application. Herein, the introduction of Pr3+ at the A sites and the rapid quenching are synergistically applied to achieve the single-phase Bi1−xPrxFeO3 ceramics and improve its electrical properties. The effects of Pr3+ on the microstructure, dielectric properties, and ferroelectric properties of Bi1−xPrxFeO3 ceramics were systematically studied. The results show that the Bi1−xPrxFeO3 (x = 0–0.075) ceramics prepared by the rapid quenching method are primarily rhombohedral phases, and the introduction of Pr3+ significantly inhibits the formation of impurity phase. The partial substitution of more stable Pr3+ for Bi3+ not only refines the grain size of Bi1−xPrxFeO3 ceramics but also significantly reduces their leakage current density. Moreover, the introduction of Pr3+ also lead to the increased remnant polarization of BiFeO3 ceramics. The synergistic effect of rapid quenching and Pr3⁺ doping plays a critical role in improving the electrical properties of BiFeO3 ceramics.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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