{"title":"具有多个伪晶量子阱的外延纳米异质结构的晶体结构分析Inх{Ga\\(_{{{\\mathbf{1}}-x}}\\) GaAs (100), (110), (111)А衬底}上的As/GaAs","authors":"E. A. Klimov, A. N. Klochkov, S. S. Pushkarev","doi":"10.1134/S1063774524602764","DOIUrl":null,"url":null,"abstract":"<p>The crystal structures of the epitaxial multilayer films {In<sub>0.1</sub>Ga<sub>0.9</sub>As/GaAs} × 10 and {In<sub>0.2</sub>Ga<sub>0.8</sub>As/GaAs} × 10 grown on GaAs substrates with different orientations, (100), (110), and (111)<i>А</i>, were studied in order to elucidate specific features, which can be related to the previously found efficiency of the terahertz emission generation in films with (110) and (111)<i>А</i> orientations. Significant concentrations of twins and stacking faults were found on non-standard GaAs (110) and (111)<i>А</i> substrates. The composition and thickness of individual layers of heterostructures on GaAs (100) substrates were refined based on the analysis of interference oscillations in X-ray diffraction curves.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"122 - 128"},"PeriodicalIF":0.6000,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Crystal Structure Analysis of Epitaxial Nanoheterostructures with Multiple Pseudomorphic Quantum Wells {InхGa\\\\(_{{{\\\\mathbf{1}}-x}}\\\\)As/GaAs} on GaAs (100), (110), and (111)А Substrates\",\"authors\":\"E. A. Klimov, A. N. Klochkov, S. S. Pushkarev\",\"doi\":\"10.1134/S1063774524602764\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The crystal structures of the epitaxial multilayer films {In<sub>0.1</sub>Ga<sub>0.9</sub>As/GaAs} × 10 and {In<sub>0.2</sub>Ga<sub>0.8</sub>As/GaAs} × 10 grown on GaAs substrates with different orientations, (100), (110), and (111)<i>А</i>, were studied in order to elucidate specific features, which can be related to the previously found efficiency of the terahertz emission generation in films with (110) and (111)<i>А</i> orientations. Significant concentrations of twins and stacking faults were found on non-standard GaAs (110) and (111)<i>А</i> substrates. The composition and thickness of individual layers of heterostructures on GaAs (100) substrates were refined based on the analysis of interference oscillations in X-ray diffraction curves.</p>\",\"PeriodicalId\":527,\"journal\":{\"name\":\"Crystallography Reports\",\"volume\":\"70 1\",\"pages\":\"122 - 128\"},\"PeriodicalIF\":0.6000,\"publicationDate\":\"2025-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Crystallography Reports\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1063774524602764\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"CRYSTALLOGRAPHY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Crystallography Reports","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1134/S1063774524602764","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CRYSTALLOGRAPHY","Score":null,"Total":0}
Crystal Structure Analysis of Epitaxial Nanoheterostructures with Multiple Pseudomorphic Quantum Wells {InхGa\(_{{{\mathbf{1}}-x}}\)As/GaAs} on GaAs (100), (110), and (111)А Substrates
The crystal structures of the epitaxial multilayer films {In0.1Ga0.9As/GaAs} × 10 and {In0.2Ga0.8As/GaAs} × 10 grown on GaAs substrates with different orientations, (100), (110), and (111)А, were studied in order to elucidate specific features, which can be related to the previously found efficiency of the terahertz emission generation in films with (110) and (111)А orientations. Significant concentrations of twins and stacking faults were found on non-standard GaAs (110) and (111)А substrates. The composition and thickness of individual layers of heterostructures on GaAs (100) substrates were refined based on the analysis of interference oscillations in X-ray diffraction curves.
期刊介绍:
Crystallography Reports is a journal that publishes original articles short communications, and reviews on various aspects of crystallography: diffraction and scattering of X-rays, electrons, and neutrons, determination of crystal structure of inorganic and organic substances, including proteins and other biological substances; UV-VIS and IR spectroscopy; growth, imperfect structure and physical properties of crystals; thin films, liquid crystals, nanomaterials, partially disordered systems, and the methods of studies.