{"title":"一种改进的z -缓冲加速PO法用于电大目标的电磁散射","authors":"Jiangfei Bai;Shunchuan Yang;Donglin Su","doi":"10.23919/cje.2024.00.025","DOIUrl":null,"url":null,"abstract":"The physical optics (PO) method is widely used to solve the electromagnetic (EM) scattering problems involving electrically large structures, in which each surface element is required to determine whether it is blocked by others. It may suffer from the computational efficiency issue due to elementwise shadowing testing. In this paper, an efficient Z-buffer based shadowing testing method is proposed to accelerate this procedure. In this method, all triangular facets are first mapped to a grid plane using the Z-buffer method, and for each grid cell, all projected triangles that intersect it are recorded. Then, rigorous shadowing testing is made for all facets recorded in the grid where the centroid of each triangle is projected. It can avoid a large number of redundant operations for pairs of triangles with no occlusion relation, which leads to the same accuracy as the traditional rigorous shadowing testing method while significantly inproving efficiency. Four numerical examples are carried out to validate its accuracy and efficiency.","PeriodicalId":50701,"journal":{"name":"Chinese Journal of Electronics","volume":"34 2","pages":"475-482"},"PeriodicalIF":1.6000,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10982050","citationCount":"0","resultStr":"{\"title\":\"An Improved Z-Buffer Accelerated PO Method for EM Scattering from Electrically Large Targets\",\"authors\":\"Jiangfei Bai;Shunchuan Yang;Donglin Su\",\"doi\":\"10.23919/cje.2024.00.025\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The physical optics (PO) method is widely used to solve the electromagnetic (EM) scattering problems involving electrically large structures, in which each surface element is required to determine whether it is blocked by others. It may suffer from the computational efficiency issue due to elementwise shadowing testing. In this paper, an efficient Z-buffer based shadowing testing method is proposed to accelerate this procedure. In this method, all triangular facets are first mapped to a grid plane using the Z-buffer method, and for each grid cell, all projected triangles that intersect it are recorded. Then, rigorous shadowing testing is made for all facets recorded in the grid where the centroid of each triangle is projected. It can avoid a large number of redundant operations for pairs of triangles with no occlusion relation, which leads to the same accuracy as the traditional rigorous shadowing testing method while significantly inproving efficiency. Four numerical examples are carried out to validate its accuracy and efficiency.\",\"PeriodicalId\":50701,\"journal\":{\"name\":\"Chinese Journal of Electronics\",\"volume\":\"34 2\",\"pages\":\"475-482\"},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2025-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10982050\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Chinese Journal of Electronics\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10982050/\",\"RegionNum\":4,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Chinese Journal of Electronics","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10982050/","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
An Improved Z-Buffer Accelerated PO Method for EM Scattering from Electrically Large Targets
The physical optics (PO) method is widely used to solve the electromagnetic (EM) scattering problems involving electrically large structures, in which each surface element is required to determine whether it is blocked by others. It may suffer from the computational efficiency issue due to elementwise shadowing testing. In this paper, an efficient Z-buffer based shadowing testing method is proposed to accelerate this procedure. In this method, all triangular facets are first mapped to a grid plane using the Z-buffer method, and for each grid cell, all projected triangles that intersect it are recorded. Then, rigorous shadowing testing is made for all facets recorded in the grid where the centroid of each triangle is projected. It can avoid a large number of redundant operations for pairs of triangles with no occlusion relation, which leads to the same accuracy as the traditional rigorous shadowing testing method while significantly inproving efficiency. Four numerical examples are carried out to validate its accuracy and efficiency.
期刊介绍:
CJE focuses on the emerging fields of electronics, publishing innovative and transformative research papers. Most of the papers published in CJE are from universities and research institutes, presenting their innovative research results. Both theoretical and practical contributions are encouraged, and original research papers reporting novel solutions to the hot topics in electronics are strongly recommended.