一种改进的z -缓冲加速PO法用于电大目标的电磁散射

IF 1.6 4区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Jiangfei Bai;Shunchuan Yang;Donglin Su
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引用次数: 0

摘要

物理光学(PO)方法被广泛用于解决涉及电大结构的电磁散射问题,其中每个表面元素都需要确定它是否被其他表面元素阻挡。由于元素遮蔽测试,它可能会受到计算效率问题的影响。本文提出了一种有效的基于z缓冲区的阴影测试方法来加速这一过程。在这种方法中,所有三角形切面首先使用Z-buffer方法映射到网格平面,并且对于每个网格单元,记录与之相交的所有投影三角形。然后,对网格中记录的所有切面进行严格的阴影测试,其中每个三角形的质心被投影。该方法可以避免对没有遮挡关系的三角形对进行大量的冗余运算,在保证精度的同时显著提高了效率。通过四个算例验证了该方法的准确性和有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Improved Z-Buffer Accelerated PO Method for EM Scattering from Electrically Large Targets
The physical optics (PO) method is widely used to solve the electromagnetic (EM) scattering problems involving electrically large structures, in which each surface element is required to determine whether it is blocked by others. It may suffer from the computational efficiency issue due to elementwise shadowing testing. In this paper, an efficient Z-buffer based shadowing testing method is proposed to accelerate this procedure. In this method, all triangular facets are first mapped to a grid plane using the Z-buffer method, and for each grid cell, all projected triangles that intersect it are recorded. Then, rigorous shadowing testing is made for all facets recorded in the grid where the centroid of each triangle is projected. It can avoid a large number of redundant operations for pairs of triangles with no occlusion relation, which leads to the same accuracy as the traditional rigorous shadowing testing method while significantly inproving efficiency. Four numerical examples are carried out to validate its accuracy and efficiency.
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来源期刊
Chinese Journal of Electronics
Chinese Journal of Electronics 工程技术-工程:电子与电气
CiteScore
3.70
自引率
16.70%
发文量
342
审稿时长
12.0 months
期刊介绍: CJE focuses on the emerging fields of electronics, publishing innovative and transformative research papers. Most of the papers published in CJE are from universities and research institutes, presenting their innovative research results. Both theoretical and practical contributions are encouraged, and original research papers reporting novel solutions to the hot topics in electronics are strongly recommended.
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