深度学习在电断层成像图像重建中的应用综述

IF 4.3 2区 综合性期刊 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Yong Li;Qingli Zhu;Ze Liu
{"title":"深度学习在电断层成像图像重建中的应用综述","authors":"Yong Li;Qingli Zhu;Ze Liu","doi":"10.1109/JSEN.2025.3554696","DOIUrl":null,"url":null,"abstract":"Electrical tomography (ET) has emerged as a safe and real-time imaging technology for decades due to its fast, noninvasive, and radiation-free characteristics. By reconstructing the spatial distribution or dynamic changes in the electrical properties of target regions, ET finds broad applications in nondestructive testing, industrial process monitoring, and biomedical research. Recent advancements in deep learning have significantly enhanced the accuracy, efficiency, and robustness of ET image reconstruction, particularly in electrical impedance tomography (EIT), electrical capacitance tomography (ECT), and electromagnetic tomography (EMT). Despite the growing interest, challenges persist in handling the ill-posed nature of ET imaging, especially for EMT, which remains underexplored compared to EIT and ECT. This review delves into the fundamental principles of ET and surveys recent progress in deep learning-driven approaches. We focus on two key paradigms: direct reconstruction networks (data-driven) and hybrid frameworks that integrate deep learning with classical algorithms (image-driven). The discussion highlights emerging trends, including multimodal ET integration, dataset optimization, and the design of advanced neural architectures tailored for ET-specific constraints. This study underscores the potential of deep learning to redefine ET systems, paving the way for more intelligent, versatile, and accurate imaging solutions.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 9","pages":"14522-14538"},"PeriodicalIF":4.3000,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Deep Learning for Image Reconstruction in Electrical Tomography: A Review\",\"authors\":\"Yong Li;Qingli Zhu;Ze Liu\",\"doi\":\"10.1109/JSEN.2025.3554696\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrical tomography (ET) has emerged as a safe and real-time imaging technology for decades due to its fast, noninvasive, and radiation-free characteristics. By reconstructing the spatial distribution or dynamic changes in the electrical properties of target regions, ET finds broad applications in nondestructive testing, industrial process monitoring, and biomedical research. Recent advancements in deep learning have significantly enhanced the accuracy, efficiency, and robustness of ET image reconstruction, particularly in electrical impedance tomography (EIT), electrical capacitance tomography (ECT), and electromagnetic tomography (EMT). Despite the growing interest, challenges persist in handling the ill-posed nature of ET imaging, especially for EMT, which remains underexplored compared to EIT and ECT. This review delves into the fundamental principles of ET and surveys recent progress in deep learning-driven approaches. We focus on two key paradigms: direct reconstruction networks (data-driven) and hybrid frameworks that integrate deep learning with classical algorithms (image-driven). The discussion highlights emerging trends, including multimodal ET integration, dataset optimization, and the design of advanced neural architectures tailored for ET-specific constraints. This study underscores the potential of deep learning to redefine ET systems, paving the way for more intelligent, versatile, and accurate imaging solutions.\",\"PeriodicalId\":447,\"journal\":{\"name\":\"IEEE Sensors Journal\",\"volume\":\"25 9\",\"pages\":\"14522-14538\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2025-03-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Sensors Journal\",\"FirstCategoryId\":\"103\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10945929/\",\"RegionNum\":2,\"RegionCategory\":\"综合性期刊\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Sensors Journal","FirstCategoryId":"103","ListUrlMain":"https://ieeexplore.ieee.org/document/10945929/","RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

几十年来,由于其快速、无创和无辐射的特点,电断层扫描(ET)已经成为一种安全、实时的成像技术。通过重建目标区域电特性的空间分布或动态变化,ET在无损检测、工业过程监测和生物医学研究中有着广泛的应用。深度学习的最新进展显著提高了ET图像重建的准确性、效率和鲁棒性,特别是在电阻抗断层扫描(EIT)、电容断层扫描(ECT)和电磁断层扫描(EMT)方面。尽管人们越来越感兴趣,但在处理ET成像的病态性方面仍然存在挑战,特别是EMT,与EIT和ECT相比,EMT仍未得到充分的探索。这篇综述深入探讨了ET的基本原理,并调查了深度学习驱动方法的最新进展。我们专注于两个关键范例:直接重建网络(数据驱动)和将深度学习与经典算法(图像驱动)集成的混合框架。讨论强调了新兴趋势,包括多模态ET集成、数据集优化以及为ET特定约束量身定制的高级神经架构设计。这项研究强调了深度学习重新定义ET系统的潜力,为更智能、更通用、更准确的成像解决方案铺平了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Deep Learning for Image Reconstruction in Electrical Tomography: A Review
Electrical tomography (ET) has emerged as a safe and real-time imaging technology for decades due to its fast, noninvasive, and radiation-free characteristics. By reconstructing the spatial distribution or dynamic changes in the electrical properties of target regions, ET finds broad applications in nondestructive testing, industrial process monitoring, and biomedical research. Recent advancements in deep learning have significantly enhanced the accuracy, efficiency, and robustness of ET image reconstruction, particularly in electrical impedance tomography (EIT), electrical capacitance tomography (ECT), and electromagnetic tomography (EMT). Despite the growing interest, challenges persist in handling the ill-posed nature of ET imaging, especially for EMT, which remains underexplored compared to EIT and ECT. This review delves into the fundamental principles of ET and surveys recent progress in deep learning-driven approaches. We focus on two key paradigms: direct reconstruction networks (data-driven) and hybrid frameworks that integrate deep learning with classical algorithms (image-driven). The discussion highlights emerging trends, including multimodal ET integration, dataset optimization, and the design of advanced neural architectures tailored for ET-specific constraints. This study underscores the potential of deep learning to redefine ET systems, paving the way for more intelligent, versatile, and accurate imaging solutions.
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来源期刊
IEEE Sensors Journal
IEEE Sensors Journal 工程技术-工程:电子与电气
CiteScore
7.70
自引率
14.00%
发文量
2058
审稿时长
5.2 months
期刊介绍: The fields of interest of the IEEE Sensors Journal are the theory, design , fabrication, manufacturing and applications of devices for sensing and transducing physical, chemical and biological phenomena, with emphasis on the electronics and physics aspect of sensors and integrated sensors-actuators. IEEE Sensors Journal deals with the following: -Sensor Phenomenology, Modelling, and Evaluation -Sensor Materials, Processing, and Fabrication -Chemical and Gas Sensors -Microfluidics and Biosensors -Optical Sensors -Physical Sensors: Temperature, Mechanical, Magnetic, and others -Acoustic and Ultrasonic Sensors -Sensor Packaging -Sensor Networks -Sensor Applications -Sensor Systems: Signals, Processing, and Interfaces -Actuators and Sensor Power Systems -Sensor Signal Processing for high precision and stability (amplification, filtering, linearization, modulation/demodulation) and under harsh conditions (EMC, radiation, humidity, temperature); energy consumption/harvesting -Sensor Data Processing (soft computing with sensor data, e.g., pattern recognition, machine learning, evolutionary computation; sensor data fusion, processing of wave e.g., electromagnetic and acoustic; and non-wave, e.g., chemical, gravity, particle, thermal, radiative and non-radiative sensor data, detection, estimation and classification based on sensor data) -Sensors in Industrial Practice
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