{"title":"深度学习在电断层成像图像重建中的应用综述","authors":"Yong Li;Qingli Zhu;Ze Liu","doi":"10.1109/JSEN.2025.3554696","DOIUrl":null,"url":null,"abstract":"Electrical tomography (ET) has emerged as a safe and real-time imaging technology for decades due to its fast, noninvasive, and radiation-free characteristics. By reconstructing the spatial distribution or dynamic changes in the electrical properties of target regions, ET finds broad applications in nondestructive testing, industrial process monitoring, and biomedical research. Recent advancements in deep learning have significantly enhanced the accuracy, efficiency, and robustness of ET image reconstruction, particularly in electrical impedance tomography (EIT), electrical capacitance tomography (ECT), and electromagnetic tomography (EMT). Despite the growing interest, challenges persist in handling the ill-posed nature of ET imaging, especially for EMT, which remains underexplored compared to EIT and ECT. This review delves into the fundamental principles of ET and surveys recent progress in deep learning-driven approaches. We focus on two key paradigms: direct reconstruction networks (data-driven) and hybrid frameworks that integrate deep learning with classical algorithms (image-driven). The discussion highlights emerging trends, including multimodal ET integration, dataset optimization, and the design of advanced neural architectures tailored for ET-specific constraints. This study underscores the potential of deep learning to redefine ET systems, paving the way for more intelligent, versatile, and accurate imaging solutions.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 9","pages":"14522-14538"},"PeriodicalIF":4.3000,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Deep Learning for Image Reconstruction in Electrical Tomography: A Review\",\"authors\":\"Yong Li;Qingli Zhu;Ze Liu\",\"doi\":\"10.1109/JSEN.2025.3554696\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrical tomography (ET) has emerged as a safe and real-time imaging technology for decades due to its fast, noninvasive, and radiation-free characteristics. By reconstructing the spatial distribution or dynamic changes in the electrical properties of target regions, ET finds broad applications in nondestructive testing, industrial process monitoring, and biomedical research. Recent advancements in deep learning have significantly enhanced the accuracy, efficiency, and robustness of ET image reconstruction, particularly in electrical impedance tomography (EIT), electrical capacitance tomography (ECT), and electromagnetic tomography (EMT). Despite the growing interest, challenges persist in handling the ill-posed nature of ET imaging, especially for EMT, which remains underexplored compared to EIT and ECT. This review delves into the fundamental principles of ET and surveys recent progress in deep learning-driven approaches. We focus on two key paradigms: direct reconstruction networks (data-driven) and hybrid frameworks that integrate deep learning with classical algorithms (image-driven). The discussion highlights emerging trends, including multimodal ET integration, dataset optimization, and the design of advanced neural architectures tailored for ET-specific constraints. This study underscores the potential of deep learning to redefine ET systems, paving the way for more intelligent, versatile, and accurate imaging solutions.\",\"PeriodicalId\":447,\"journal\":{\"name\":\"IEEE Sensors Journal\",\"volume\":\"25 9\",\"pages\":\"14522-14538\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2025-03-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Sensors Journal\",\"FirstCategoryId\":\"103\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10945929/\",\"RegionNum\":2,\"RegionCategory\":\"综合性期刊\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Sensors Journal","FirstCategoryId":"103","ListUrlMain":"https://ieeexplore.ieee.org/document/10945929/","RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Deep Learning for Image Reconstruction in Electrical Tomography: A Review
Electrical tomography (ET) has emerged as a safe and real-time imaging technology for decades due to its fast, noninvasive, and radiation-free characteristics. By reconstructing the spatial distribution or dynamic changes in the electrical properties of target regions, ET finds broad applications in nondestructive testing, industrial process monitoring, and biomedical research. Recent advancements in deep learning have significantly enhanced the accuracy, efficiency, and robustness of ET image reconstruction, particularly in electrical impedance tomography (EIT), electrical capacitance tomography (ECT), and electromagnetic tomography (EMT). Despite the growing interest, challenges persist in handling the ill-posed nature of ET imaging, especially for EMT, which remains underexplored compared to EIT and ECT. This review delves into the fundamental principles of ET and surveys recent progress in deep learning-driven approaches. We focus on two key paradigms: direct reconstruction networks (data-driven) and hybrid frameworks that integrate deep learning with classical algorithms (image-driven). The discussion highlights emerging trends, including multimodal ET integration, dataset optimization, and the design of advanced neural architectures tailored for ET-specific constraints. This study underscores the potential of deep learning to redefine ET systems, paving the way for more intelligent, versatile, and accurate imaging solutions.
期刊介绍:
The fields of interest of the IEEE Sensors Journal are the theory, design , fabrication, manufacturing and applications of devices for sensing and transducing physical, chemical and biological phenomena, with emphasis on the electronics and physics aspect of sensors and integrated sensors-actuators. IEEE Sensors Journal deals with the following:
-Sensor Phenomenology, Modelling, and Evaluation
-Sensor Materials, Processing, and Fabrication
-Chemical and Gas Sensors
-Microfluidics and Biosensors
-Optical Sensors
-Physical Sensors: Temperature, Mechanical, Magnetic, and others
-Acoustic and Ultrasonic Sensors
-Sensor Packaging
-Sensor Networks
-Sensor Applications
-Sensor Systems: Signals, Processing, and Interfaces
-Actuators and Sensor Power Systems
-Sensor Signal Processing for high precision and stability (amplification, filtering, linearization, modulation/demodulation) and under harsh conditions (EMC, radiation, humidity, temperature); energy consumption/harvesting
-Sensor Data Processing (soft computing with sensor data, e.g., pattern recognition, machine learning, evolutionary computation; sensor data fusion, processing of wave e.g., electromagnetic and acoustic; and non-wave, e.g., chemical, gravity, particle, thermal, radiative and non-radiative sensor data, detection, estimation and classification based on sensor data)
-Sensors in Industrial Practice