多比特ΔΣ adc的先入后出数据加权平均技术

IF 4 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Xing Wang;Chaoyang Xing;Yi Zhong;Lu Jie;Nan Sun
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引用次数: 0

摘要

数据加权平均(DWA)是一种常用的动态元素匹配(DEM)技术,用于确定$\Delta \Sigma $ adc的失配误差。然而,DWA面临着噪声整形能力弱的问题,并且在小信号输入下会产生谐波失真。相比之下,二阶DEM解决了这些问题,但存在硬件复杂度高的问题。为了解决这些问题,本文简要介绍了用于多位$\Delta \Sigma $ adc的先入后出DWA (FILO-DWA)技术。该技术结合了DWA和二阶DEM的优点。与DWA相比,它不引入谐波,提高了失配整形能力。与基于二阶矢量量化器(VQ-based)的DEM方案相比,该方案在整形能力损失可以忽略不计的情况下实现了10倍以上的硬件成本降低。该技术为高精度$\Delta \Sigma $ ADC设计提供了一种可行的DWA替代方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
First-In-Last-Out Data Weighted Averaging Technique for Multi-Bit ΔΣ ADCs
Data weighted averaging (DWA) is a frequently used dynamic element matching (DEM) technique to shape the mismatch error in $\Delta \Sigma $ ADCs. However, DWA faces a weak noise-shaping capability issue and introduces harmonic distortion under small signal inputs. By contrast, 2nd-order DEM solves these problems but suffers from the high hardware complexity issue. To address these issues, this brief presents a first-in-last-out DWA (FILO-DWA) technique for multi-bit $\Delta \Sigma $ ADCs. This technique combines the merits of DWA and 2nd-order DEM. Compared with DWA, it introduces no harmonics and enhances the mismatch shaping ability. In contrast to the 2nd-order vector-quantizer-based (VQ-based) DEM scheme, it achieves more than 10 times hardware cost reduction with negligible shaping ability loss. This technique offers a feasible DWA alternative for high-accuracy $\Delta \Sigma $ ADC design.
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来源期刊
IEEE Transactions on Circuits and Systems II: Express Briefs
IEEE Transactions on Circuits and Systems II: Express Briefs 工程技术-工程:电子与电气
CiteScore
7.90
自引率
20.50%
发文量
883
审稿时长
3.0 months
期刊介绍: TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes: Circuits: Analog, Digital and Mixed Signal Circuits and Systems Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic Circuits and Systems, Power Electronics and Systems Software for Analog-and-Logic Circuits and Systems Control aspects of Circuits and Systems.
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