Beom Gu Lee, Jae-Yun Lee, Jeong Hun Choi, Jeong Moo Seo, Sung-Jin Kim
{"title":"基于双等离子体退火的TiO2/TiO2−x忆阻器增强开关机制","authors":"Beom Gu Lee, Jae-Yun Lee, Jeong Hun Choi, Jeong Moo Seo, Sung-Jin Kim","doi":"10.1007/s13391-025-00555-x","DOIUrl":null,"url":null,"abstract":"<div><p>High stretchability and flexibility are essential characteristics for wearable devices that attach to a living body to store data and analyze electrical signals. Memristors, the promising next generation of intelligent semiconductors, are expected to be lightweight and highly integrated by dramatically reducing device size due to its unique characteristics. The non-volatile nature of memristors is expected to be utilized in wearable devices that can store and analyze bioelectrical signals. To improve the resistive switching mechanism of the memristor, annealing process above 400 °C are widely utilized due to the certainty of the process. However, it is difficult to apply high-temperature annealing processes to flexible substrate like polyethylene terephthalate or polyethylene naphthalate. Here, we developed the low temperature Dual plasma-annealing treatment (DPA) process that combines a low-temperature annealing treatment process with an O<sub>2</sub> plasma process for glass/ITO/TiO<sub>2</sub>/TiO<sub>2−x</sub>/Ag thin film-based memristor devices, and to analyze the effect of this series DPA processes on memristor devices, we fabricated devices with different process temperatures. Also, we measured the enhancement in I–V curve, retention test and different of bandgap and ohmic conduction. The results showed that the resistive switching behavior of the device processed at 160 °C was best enhanced temperature and confirmed that the DPA process can replace the high temperature annealing treatment process and be applied to flexible substrates.</p><h3>Graphical Abstract</h3><p>Beom Gu Lee et al., TiO<sub>2</sub> memristors prepared based on sputtering-processes\nhave many advantages, such as the characteristic of resistive switching\nmechanism, However, these devices require high-temperature annealing, which\nposes challenges for their application on high-stretchable substrates. This work\nhas shown that the performance of the devices switching mechanism can be\nimproved by subjecting the devices to plasma treatment with low temperature\nannealing process. </p><div><figure><div><div><picture><source><img></source></picture></div></div></figure></div></div>","PeriodicalId":536,"journal":{"name":"Electronic Materials Letters","volume":"21 3","pages":"366 - 374"},"PeriodicalIF":2.1000,"publicationDate":"2025-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Dual Plasma-Annealing Based TiO2/TiO2−x Memristors for Enhanced Switching Mechanism\",\"authors\":\"Beom Gu Lee, Jae-Yun Lee, Jeong Hun Choi, Jeong Moo Seo, Sung-Jin Kim\",\"doi\":\"10.1007/s13391-025-00555-x\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>High stretchability and flexibility are essential characteristics for wearable devices that attach to a living body to store data and analyze electrical signals. Memristors, the promising next generation of intelligent semiconductors, are expected to be lightweight and highly integrated by dramatically reducing device size due to its unique characteristics. The non-volatile nature of memristors is expected to be utilized in wearable devices that can store and analyze bioelectrical signals. To improve the resistive switching mechanism of the memristor, annealing process above 400 °C are widely utilized due to the certainty of the process. However, it is difficult to apply high-temperature annealing processes to flexible substrate like polyethylene terephthalate or polyethylene naphthalate. Here, we developed the low temperature Dual plasma-annealing treatment (DPA) process that combines a low-temperature annealing treatment process with an O<sub>2</sub> plasma process for glass/ITO/TiO<sub>2</sub>/TiO<sub>2−x</sub>/Ag thin film-based memristor devices, and to analyze the effect of this series DPA processes on memristor devices, we fabricated devices with different process temperatures. Also, we measured the enhancement in I–V curve, retention test and different of bandgap and ohmic conduction. The results showed that the resistive switching behavior of the device processed at 160 °C was best enhanced temperature and confirmed that the DPA process can replace the high temperature annealing treatment process and be applied to flexible substrates.</p><h3>Graphical Abstract</h3><p>Beom Gu Lee et al., TiO<sub>2</sub> memristors prepared based on sputtering-processes\\nhave many advantages, such as the characteristic of resistive switching\\nmechanism, However, these devices require high-temperature annealing, which\\nposes challenges for their application on high-stretchable substrates. This work\\nhas shown that the performance of the devices switching mechanism can be\\nimproved by subjecting the devices to plasma treatment with low temperature\\nannealing process. </p><div><figure><div><div><picture><source><img></source></picture></div></div></figure></div></div>\",\"PeriodicalId\":536,\"journal\":{\"name\":\"Electronic Materials Letters\",\"volume\":\"21 3\",\"pages\":\"366 - 374\"},\"PeriodicalIF\":2.1000,\"publicationDate\":\"2025-03-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electronic Materials Letters\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s13391-025-00555-x\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electronic Materials Letters","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s13391-025-00555-x","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Dual Plasma-Annealing Based TiO2/TiO2−x Memristors for Enhanced Switching Mechanism
High stretchability and flexibility are essential characteristics for wearable devices that attach to a living body to store data and analyze electrical signals. Memristors, the promising next generation of intelligent semiconductors, are expected to be lightweight and highly integrated by dramatically reducing device size due to its unique characteristics. The non-volatile nature of memristors is expected to be utilized in wearable devices that can store and analyze bioelectrical signals. To improve the resistive switching mechanism of the memristor, annealing process above 400 °C are widely utilized due to the certainty of the process. However, it is difficult to apply high-temperature annealing processes to flexible substrate like polyethylene terephthalate or polyethylene naphthalate. Here, we developed the low temperature Dual plasma-annealing treatment (DPA) process that combines a low-temperature annealing treatment process with an O2 plasma process for glass/ITO/TiO2/TiO2−x/Ag thin film-based memristor devices, and to analyze the effect of this series DPA processes on memristor devices, we fabricated devices with different process temperatures. Also, we measured the enhancement in I–V curve, retention test and different of bandgap and ohmic conduction. The results showed that the resistive switching behavior of the device processed at 160 °C was best enhanced temperature and confirmed that the DPA process can replace the high temperature annealing treatment process and be applied to flexible substrates.
Graphical Abstract
Beom Gu Lee et al., TiO2 memristors prepared based on sputtering-processes
have many advantages, such as the characteristic of resistive switching
mechanism, However, these devices require high-temperature annealing, which
poses challenges for their application on high-stretchable substrates. This work
has shown that the performance of the devices switching mechanism can be
improved by subjecting the devices to plasma treatment with low temperature
annealing process.
期刊介绍:
Electronic Materials Letters is an official journal of the Korean Institute of Metals and Materials. It is a peer-reviewed international journal publishing print and online version. It covers all disciplines of research and technology in electronic materials. Emphasis is placed on science, engineering and applications of advanced materials, including electronic, magnetic, optical, organic, electrochemical, mechanical, and nanoscale materials. The aspects of synthesis and processing include thin films, nanostructures, self assembly, and bulk, all related to thermodynamics, kinetics and/or modeling.