纳米片晶体管:材料、器件、系统和应用

IF 3.5 3区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
A. Angelin Delighta, J. S. Raj Kumar, I. V. Binola K Jebalin, D. Nirmal
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引用次数: 0

摘要

场效应晶体管(FET)技术的不断发展对于满足日益增长的节能和高性能电子产品的需求至关重要。本文综述了低功率场效应管的半导体材料、结构、制造技术和应用等方面的研究进展。新兴材料,如二维半导体、IGZO(铟镓氧化锌)、TMDs(过渡金属二硫族化合物)和III-V化合物,在实现finfet、堆叠纳米片FET (nsfet)、垂直nsfet、树状FET和互补FET等创新FET拓扑中发挥着关键作用。这些材料具有优异的性能,如高迁移性通道,改进的可扩展性和能源效率,对于克服传统CMOS技术节点缩放带来的挑战至关重要。特别是,由于具有更好的静电控制和可调通道宽度的能力,预计nsfet将取代最先进的纳米线FET和FinFET器件。这种转变预计将在未来几年重塑半导体技术。集成这些架构的一个关键方面在于先进的制造步骤,如外延生长技术,基于间隔片的光刻和高k金属栅极(HKMG)集成,可以精确控制器件尺寸并提高性能。这些创新有助于集成各种应用的先进架构,包括逻辑电路、存储设备(包括SRAM、MRAM)、传感技术和射频应用。通过将这些材料创新与建筑进步相结合,本研究突出了它们在解决当前进展和挑战方面的综合潜力,推动了低功率场效应管的未来,并塑造了可持续的高性能现代电子产品。图形抽象
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nanosheet transistors: materials, devices, systems and applications

The continuous evolution of field-effect transistor (FET) technologies is essential to address the increasing demand for energy-efficient and high-performance electronics. This review provides a comprehensive analysis of advanced low-power FETs, focusing on semiconductor materials, architectures, fabrication techniques and applications. Emerging materials such as 2D semiconductors, IGZO (indium gallium zinc oxide), TMDs (transition metal dichalcogenides) and III–V compounds play a pivotal role in enabling innovative FET topologies like FinFETs, stacked nanosheet FETs (NSFETs), vertical NSFETs, TreeFETs and complementary FETs. These materials, with superior properties such as high-mobility channels, improved scalability and energy efficiency, are critical in overcoming the challenges posed by conventional CMOS technology node scaling. In particular, NSFETs are anticipated to substitute the state-of-the-art nanowire FET and FinFET devices due to their ability to provide better electrostatic control and tunable channel widths. This transition is expected to reshape the semiconductor technology in the years ahead. A critical aspect of integrating these architectures lies in the advanced fabrication steps such as epitaxial growth techniques, spacer-based lithography and high-k metal gate (HKMG) integration that enables precise control over device dimensions and enhancing performance. These innovations facilitate the integration of advanced architectures for diverse applications including logic circuits, memory devices including SRAM, MRAM, sensing technologies and RF applications. By incorporating these material innovations with architectural advancements, this study highlights their combined potential to address current progress and challenges, driving the future of low-power FETs and shaping sustainable high-performing modern electronics.

Graphical Abstract

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来源期刊
Journal of Materials Science
Journal of Materials Science 工程技术-材料科学:综合
CiteScore
7.90
自引率
4.40%
发文量
1297
审稿时长
2.4 months
期刊介绍: The Journal of Materials Science publishes reviews, full-length papers, and short Communications recording original research results on, or techniques for studying the relationship between structure, properties, and uses of materials. The subjects are seen from international and interdisciplinary perspectives covering areas including metals, ceramics, glasses, polymers, electrical materials, composite materials, fibers, nanostructured materials, nanocomposites, and biological and biomedical materials. The Journal of Materials Science is now firmly established as the leading source of primary communication for scientists investigating the structure and properties of all engineering materials.
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