ARM微处理器的软错误检测与执行观察

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Manuel Peña-Fernández;Borja Verdasco;Luis Entrena;Almudena Lindoso
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引用次数: 0

摘要

我们提出了一种名为跟踪实时分析仪的知识产权(IP),用于检查辐射下的处理器错误(TRACER),旨在检测错误并观察高级RISC机器(ARM)处理器架构在执行过程中使用跟踪接口提供的信息以非侵入式方式执行的行为。TRACER IP采用模块化设计,可以参数化,以适应各种ARM处理器实现和软件应用。它通过ARM跟踪嵌入式模块[仪器跟踪宏单元(ITM)、程序跟踪宏单元(PTM)和嵌入式跟踪宏单元(ETM)]支持程序和数据跟踪。在Cortex-A9和Cortex-M7两种不同架构的处理器上进行了重离子实验。结果表明,所提出的IP可以提供非常高的错误检测能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Soft-Error Detection and Execution Observation for ARM Microprocessors
We present an intellectual property (IP) called a trace real-time analyzer to check processor errors under radiation (TRACER) designed to detect errors and observe the behavior of advanced RISC machines (ARM) processor architectures during execution in a non-intrusive manner using the information provided by the trace interface. The TRACER IP has a modular design that can be parameterized to fit a wide variety of ARM processor implementations and software applications. It supports both program and data tracing through the ARM trace embedded modules [instrumentation trace macrocell (ITM), program trace macrocell (PTM), and embedded trace macrocell (ETM)]. Experimental results with heavy ions have been conducted on two different processors with Cortex-A9 and Cortex-M7 architectures, respectively. The results demonstrate that the proposed IP can provide very high error detection capabilities.
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来源期刊
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science 工程技术-工程:电子与电气
CiteScore
3.70
自引率
27.80%
发文量
314
审稿时长
6.2 months
期刊介绍: The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years. The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.
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