从存储器中的辐射地面测试中估计SBU/MCU横截面的最佳拟合技术

IF 1.9 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Nuclear Science Pub Date : 2025-02-07 DOI:10.1109/TNS.2025.3539956

Francisco J. Franco;Juan C. Fabero;Hortensia Mecha;Mohammadreza Rezaei;Guillaume Hubert;Juan A. Clemente

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引用次数: 0

摘要

本文研究了仅发生单位扰流（SBUs）和多单元扰流（mcu）的存储设备的辐射接地测试中每轮读取预期位翻转数的概率分布。利用该分布估计实际实验中的软误差截面，采用两种最佳拟合方法：基于梯度下降（GD）算法和基于遗传算法（GAs）。此外，还探讨了该数学研究如何适用于检测软误差率（SER）可能由于辐射通量变化等不同原因而发生的变化。最后，利用实验固有的随机特性，为检测实验数据造假提供了工具。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Best-Fit Techniques to Estimate SBU/MCU Cross Sections From Radiation-Ground Tests in Memories

This article studies the probability distribution for the expected number of bitflips per round of reading in radiation-ground tests on a memory device where only single-bit upsets (SBUs) and multiple-cell upsets (MCUs) occur. This distribution is used to estimate the soft error cross sections in actual experiments by means of two best-fit approaches: one based on the gradient descent (GD) algorithm and the other on genetic algorithms (GAs). Besides, it is investigated how this mathematical study is suitable to detect possible variations in the soft error rate (SER) due to different reasons, such as variations in the radiation flux. Finally, the inherent stochastic characteristics of the experiments are used to provide tools to detect forgery in experiment data.

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来源期刊

IEEE Transactions on Nuclear Science 工程技术-工程：电子与电气

CiteScore

3.70

自引率

27.80%

发文量

314

审稿时长

6.2 months

期刊介绍： The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years. The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.