P. Elaiyaraja, N. Karunagaran, M. Muralidharan, S. Gokul Raj
{"title":"掺杂诱导的(1−x) NaNbO3-xBiGdKZrO3微电子陶瓷的结构、光学和电学修饰","authors":"P. Elaiyaraja, N. Karunagaran, M. Muralidharan, S. Gokul Raj","doi":"10.1007/s10854-025-14830-y","DOIUrl":null,"url":null,"abstract":"<div><p>A two-step sintering process was used to create ceramics composed of lead-free (1-x)NaNbO<sub>3</sub>-xBiGdKZrO<sub>3</sub> (x = 0.00, 0.02, 0.04, 0.06), and their electrical, optical, and structural properties were investigated. The XRD results revealed that all of the combinations exhibited a perovskite structure, with a phase transition from orthorhombic (Pbma) to pseudo-cubic (Pm-3 m) at x = 0.04. The lattice parameters changed from a = 3.938 °C, b = 3.927 °C, and c = 3.915 °C (x = 0.00) to a = 3.952 °C, b = 3.952 °C, and c = 3.949 °C (x = 0.06), which means there is more symmetry and defects are relaxing. Raman spectroscopy revealed a peak shift from 277 to 251 cm⁻<sup>1</sup> and an FWHM increase from 24.96 cm⁻<sup>1</sup> (x = 0.00) to 27.66 cm⁻<sup>1</sup> (x = 0.06), confirming defect-driven structural modifications and a transition to cubic symmetry. XPS analysis confirmed the successful incorporation of BiGdKZrO₃ by identifying oxidation states and chemical bonding. The UV–Vis spectra showed a band gap between 3.34 and 3.41 eV, which is caused by charge correction and band tailing caused by defects. FE-SEM and HRTEM studies showed that the grains are spread out evenly and that the lattice was significantly distorted at x = 0.04. The SAED patterns changed to dispersed rings, which confirmed the phase transition and the development of defects. Electrical impedance spectroscopy showed enhanced AC conductivity with increasing frequency and temperature (410–500 °C, 1 Hz–1 MHz). Complex permittivity (εʹ) increased from 215 (x = 0.00) to 287 (x = 0.06) at 1 MHz, while AC conductivity at 500 °C rose from 1.2 × 10⁻<sup>5</sup> S/cm (x = 0.00) to 3.8 × 10⁻<sup>5</sup> S/cm (x = 0.06), confirming enhanced charge transport. The real and imaginary permittivity exhibited frequency-dependent relaxation behavior, while electrical modulus analysis indicated bulk and grain boundary contributions. At higher dopant concentrations, the materials showed negative permittivity, which may be attributed to flexoelectric effects and dipolar polarization.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 12","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Doping-induced structural, optical, and electrical modifications in (1−x)NaNbO3–xBiGdKZrO3 ceramics for microelectronic applications\",\"authors\":\"P. Elaiyaraja, N. Karunagaran, M. Muralidharan, S. Gokul Raj\",\"doi\":\"10.1007/s10854-025-14830-y\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A two-step sintering process was used to create ceramics composed of lead-free (1-x)NaNbO<sub>3</sub>-xBiGdKZrO<sub>3</sub> (x = 0.00, 0.02, 0.04, 0.06), and their electrical, optical, and structural properties were investigated. The XRD results revealed that all of the combinations exhibited a perovskite structure, with a phase transition from orthorhombic (Pbma) to pseudo-cubic (Pm-3 m) at x = 0.04. The lattice parameters changed from a = 3.938 °C, b = 3.927 °C, and c = 3.915 °C (x = 0.00) to a = 3.952 °C, b = 3.952 °C, and c = 3.949 °C (x = 0.06), which means there is more symmetry and defects are relaxing. Raman spectroscopy revealed a peak shift from 277 to 251 cm⁻<sup>1</sup> and an FWHM increase from 24.96 cm⁻<sup>1</sup> (x = 0.00) to 27.66 cm⁻<sup>1</sup> (x = 0.06), confirming defect-driven structural modifications and a transition to cubic symmetry. XPS analysis confirmed the successful incorporation of BiGdKZrO₃ by identifying oxidation states and chemical bonding. The UV–Vis spectra showed a band gap between 3.34 and 3.41 eV, which is caused by charge correction and band tailing caused by defects. FE-SEM and HRTEM studies showed that the grains are spread out evenly and that the lattice was significantly distorted at x = 0.04. The SAED patterns changed to dispersed rings, which confirmed the phase transition and the development of defects. Electrical impedance spectroscopy showed enhanced AC conductivity with increasing frequency and temperature (410–500 °C, 1 Hz–1 MHz). Complex permittivity (εʹ) increased from 215 (x = 0.00) to 287 (x = 0.06) at 1 MHz, while AC conductivity at 500 °C rose from 1.2 × 10⁻<sup>5</sup> S/cm (x = 0.00) to 3.8 × 10⁻<sup>5</sup> S/cm (x = 0.06), confirming enhanced charge transport. The real and imaginary permittivity exhibited frequency-dependent relaxation behavior, while electrical modulus analysis indicated bulk and grain boundary contributions. At higher dopant concentrations, the materials showed negative permittivity, which may be attributed to flexoelectric effects and dipolar polarization.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":\"36 12\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-04-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-025-14830-y\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-14830-y","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Doping-induced structural, optical, and electrical modifications in (1−x)NaNbO3–xBiGdKZrO3 ceramics for microelectronic applications
A two-step sintering process was used to create ceramics composed of lead-free (1-x)NaNbO3-xBiGdKZrO3 (x = 0.00, 0.02, 0.04, 0.06), and their electrical, optical, and structural properties were investigated. The XRD results revealed that all of the combinations exhibited a perovskite structure, with a phase transition from orthorhombic (Pbma) to pseudo-cubic (Pm-3 m) at x = 0.04. The lattice parameters changed from a = 3.938 °C, b = 3.927 °C, and c = 3.915 °C (x = 0.00) to a = 3.952 °C, b = 3.952 °C, and c = 3.949 °C (x = 0.06), which means there is more symmetry and defects are relaxing. Raman spectroscopy revealed a peak shift from 277 to 251 cm⁻1 and an FWHM increase from 24.96 cm⁻1 (x = 0.00) to 27.66 cm⁻1 (x = 0.06), confirming defect-driven structural modifications and a transition to cubic symmetry. XPS analysis confirmed the successful incorporation of BiGdKZrO₃ by identifying oxidation states and chemical bonding. The UV–Vis spectra showed a band gap between 3.34 and 3.41 eV, which is caused by charge correction and band tailing caused by defects. FE-SEM and HRTEM studies showed that the grains are spread out evenly and that the lattice was significantly distorted at x = 0.04. The SAED patterns changed to dispersed rings, which confirmed the phase transition and the development of defects. Electrical impedance spectroscopy showed enhanced AC conductivity with increasing frequency and temperature (410–500 °C, 1 Hz–1 MHz). Complex permittivity (εʹ) increased from 215 (x = 0.00) to 287 (x = 0.06) at 1 MHz, while AC conductivity at 500 °C rose from 1.2 × 10⁻5 S/cm (x = 0.00) to 3.8 × 10⁻5 S/cm (x = 0.06), confirming enhanced charge transport. The real and imaginary permittivity exhibited frequency-dependent relaxation behavior, while electrical modulus analysis indicated bulk and grain boundary contributions. At higher dopant concentrations, the materials showed negative permittivity, which may be attributed to flexoelectric effects and dipolar polarization.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.