双离子萃取过程中电子聚焦加热现象的粒子池（PIC）模拟

IF 1.3 4区物理与天体物理 Q3 PHYSICS, FLUIDS & PLASMAS

Contributions to Plasma Physics Pub Date : 2025-01-21 DOI:10.1002/ctpp.202400049

Xiaoyong Lu, Liangwei Liu

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引用次数: 0

摘要

本文对电子聚焦加热现象进行了双侧离子萃取过程的粒子池模拟。对负热效应的机理和特点进行了模拟分析。数值计算了几个因素对电子受热度和离子收集率的影响。最后讨论了负加热效应与萃取不稳定现象之间的关系，并提出了缓解加热效应的方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Particle-In-Cell (PIC) Simulations of Electron Focusing Heating Phenomena in Bilateral Ion Extraction Process

Particle-in-cell simulations of bilateral ion extraction process are carried out for electron focusing heating phenomenon in this work. The mechanisms and characteristics of the negative heating effect are simulated and analyzed. Then influences of several factors on electron heating degree and ion collection ratio are provided numerically. Finally, relations between the negative heating effect and extraction instability phenomenon are discussed and an approach to mitigate the heating effect is given.

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来源期刊

Contributions to Plasma Physics 物理-物理：流体与等离子体

CiteScore

2.90

自引率

12.50%

发文量

110

审稿时长

4-8 weeks

期刊介绍： Aims and Scope of Contributions to Plasma Physics: Basic physics of low-temperature plasmas; Strongly correlated non-ideal plasmas; Dusty Plasmas; Plasma discharges - microplasmas, reactive, and atmospheric pressure plasmas; Plasma diagnostics; Plasma-surface interaction; Plasma technology; Plasma medicine.