Asif Mirza;Ryan E. Gloekler;Sudeep Pasricha;Mahdi Nikdast
{"title":"硅光子微环谐振器工艺变化弹性设计的自动化设计与分析框架","authors":"Asif Mirza;Ryan E. Gloekler;Sudeep Pasricha;Mahdi Nikdast","doi":"10.1109/TCAD.2024.3505078","DOIUrl":null,"url":null,"abstract":"Silicon photonics promises revolutionary advancements in communication and computing, leveraging the integration of photonic components onto silicon platforms. However, a critical challenge remains in achieving robust device performance under inevitable process variations inherent in CMOS fabrication. Existing design methodologies often fall short in assessing and mitigating the impact of these variations on device behavior, particularly in microring resonators (MRRs). To address this challenge, we present a novel, comprehensive workflow for designing process-variation-resilient silicon photonic MRRs, which we have integrated into a variation-aware design optimization framework called process variation analysis tool. Our approach seamlessly integrates process-variation robustness directly into the design phase, enabling early optimization of device performance characteristics. By exploring diverse process-variation scenarios, our workflow provides crucial insights into design tradeoffs and strategies for enhancing MRR robustness. Furthermore, we achieve this analysis efficiently through the use of compact models, striking a balance between accuracy and computational cost. This approach significantly reduces design cycles and resource requirements, offering a practical and cost-effective path toward optimizing MRR performance under real-world manufacturing conditions.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"44 5","pages":"1788-1792"},"PeriodicalIF":2.7000,"publicationDate":"2024-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"ProVAT: An Automated Design and Analysis Framework for Process-Variation-Resilient Design of Silicon Photonic Microring Resonators\",\"authors\":\"Asif Mirza;Ryan E. Gloekler;Sudeep Pasricha;Mahdi Nikdast\",\"doi\":\"10.1109/TCAD.2024.3505078\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silicon photonics promises revolutionary advancements in communication and computing, leveraging the integration of photonic components onto silicon platforms. However, a critical challenge remains in achieving robust device performance under inevitable process variations inherent in CMOS fabrication. Existing design methodologies often fall short in assessing and mitigating the impact of these variations on device behavior, particularly in microring resonators (MRRs). To address this challenge, we present a novel, comprehensive workflow for designing process-variation-resilient silicon photonic MRRs, which we have integrated into a variation-aware design optimization framework called process variation analysis tool. Our approach seamlessly integrates process-variation robustness directly into the design phase, enabling early optimization of device performance characteristics. By exploring diverse process-variation scenarios, our workflow provides crucial insights into design tradeoffs and strategies for enhancing MRR robustness. Furthermore, we achieve this analysis efficiently through the use of compact models, striking a balance between accuracy and computational cost. This approach significantly reduces design cycles and resource requirements, offering a practical and cost-effective path toward optimizing MRR performance under real-world manufacturing conditions.\",\"PeriodicalId\":13251,\"journal\":{\"name\":\"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems\",\"volume\":\"44 5\",\"pages\":\"1788-1792\"},\"PeriodicalIF\":2.7000,\"publicationDate\":\"2024-11-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10764749/\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10764749/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
ProVAT: An Automated Design and Analysis Framework for Process-Variation-Resilient Design of Silicon Photonic Microring Resonators
Silicon photonics promises revolutionary advancements in communication and computing, leveraging the integration of photonic components onto silicon platforms. However, a critical challenge remains in achieving robust device performance under inevitable process variations inherent in CMOS fabrication. Existing design methodologies often fall short in assessing and mitigating the impact of these variations on device behavior, particularly in microring resonators (MRRs). To address this challenge, we present a novel, comprehensive workflow for designing process-variation-resilient silicon photonic MRRs, which we have integrated into a variation-aware design optimization framework called process variation analysis tool. Our approach seamlessly integrates process-variation robustness directly into the design phase, enabling early optimization of device performance characteristics. By exploring diverse process-variation scenarios, our workflow provides crucial insights into design tradeoffs and strategies for enhancing MRR robustness. Furthermore, we achieve this analysis efficiently through the use of compact models, striking a balance between accuracy and computational cost. This approach significantly reduces design cycles and resource requirements, offering a practical and cost-effective path toward optimizing MRR performance under real-world manufacturing conditions.
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.