Co2TiSi/SiO2/n-Si异质结构中室温鲁棒三端Hanle信号的观察

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Sajib Biswas, Niladri Sekhar Kander, Safikul Islam, Amal Kumar Das
{"title":"Co2TiSi/SiO2/n-Si异质结构中室温鲁棒三端Hanle信号的观察","authors":"Sajib Biswas,&nbsp;Niladri Sekhar Kander,&nbsp;Safikul Islam,&nbsp;Amal Kumar Das","doi":"10.1007/s10854-025-14790-3","DOIUrl":null,"url":null,"abstract":"<div><p>We have studied the spin injection properties of Co<sub>2</sub>TiSi (CTS)/SiO<sub>2</sub>/n-Si heterostructure by measuring the three-terminal (3T) Hanle signal. We used n-type silicon as the semiconductor and Co<sub>2</sub>TiSi Heusler alloy as the electrode to create a standard three-terminal Hanle device for measuring the spin injection and detection. The structural and magnetic measurements verify that the Heusler alloy is growing properly. A sizable Hanle signal at room temperature verified the ferromagnetic to semiconductor spin injection. The computed spin-resistance area confirms that the accumulation took place in the semiconductor channel as opposed to the interface states. This heterostructure’s measured spin diffusion length <i>L</i><sub>SD</sub> (249 nm) and spin life time <i>τ</i> (168 ps) are quite impressive at room temperature, which makes Co<sub>2</sub>TiSi a promising option for upcoming spintronics applications.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 12","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Observation of room-temperature robust three-terminal Hanle signal in Co2TiSi/SiO2/n-Si Heterostructure\",\"authors\":\"Sajib Biswas,&nbsp;Niladri Sekhar Kander,&nbsp;Safikul Islam,&nbsp;Amal Kumar Das\",\"doi\":\"10.1007/s10854-025-14790-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>We have studied the spin injection properties of Co<sub>2</sub>TiSi (CTS)/SiO<sub>2</sub>/n-Si heterostructure by measuring the three-terminal (3T) Hanle signal. We used n-type silicon as the semiconductor and Co<sub>2</sub>TiSi Heusler alloy as the electrode to create a standard three-terminal Hanle device for measuring the spin injection and detection. The structural and magnetic measurements verify that the Heusler alloy is growing properly. A sizable Hanle signal at room temperature verified the ferromagnetic to semiconductor spin injection. The computed spin-resistance area confirms that the accumulation took place in the semiconductor channel as opposed to the interface states. This heterostructure’s measured spin diffusion length <i>L</i><sub>SD</sub> (249 nm) and spin life time <i>τ</i> (168 ps) are quite impressive at room temperature, which makes Co<sub>2</sub>TiSi a promising option for upcoming spintronics applications.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":\"36 12\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-025-14790-3\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-14790-3","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

通过测量三端(3T)汉勒信号,研究了Co2TiSi (CTS)/SiO2/n-Si异质结构的自旋注入特性。我们以n型硅为半导体,Co2TiSi Heusler合金为电极,制作了一个标准的三端Hanle装置,用于测量自旋注入和检测。结构和磁性测量证实了Heusler合金生长正常。在室温下,一个相当大的汉勒信号证实了铁磁对半导体的自旋注入。计算的自旋电阻面积证实了积累发生在半导体通道中,而不是界面状态。该异质结构在室温下的自旋扩散长度LSD (249 nm)和自旋寿命τ (168 ps)令人印象深刻,这使得Co2TiSi成为即将到来的自旋电子学应用的有希望的选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Observation of room-temperature robust three-terminal Hanle signal in Co2TiSi/SiO2/n-Si Heterostructure

We have studied the spin injection properties of Co2TiSi (CTS)/SiO2/n-Si heterostructure by measuring the three-terminal (3T) Hanle signal. We used n-type silicon as the semiconductor and Co2TiSi Heusler alloy as the electrode to create a standard three-terminal Hanle device for measuring the spin injection and detection. The structural and magnetic measurements verify that the Heusler alloy is growing properly. A sizable Hanle signal at room temperature verified the ferromagnetic to semiconductor spin injection. The computed spin-resistance area confirms that the accumulation took place in the semiconductor channel as opposed to the interface states. This heterostructure’s measured spin diffusion length LSD (249 nm) and spin life time τ (168 ps) are quite impressive at room temperature, which makes Co2TiSi a promising option for upcoming spintronics applications.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信