估计N并联电力电子变流器电磁辐射的Pearson随机游走法

IF 2.5 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Erjon Ballukja;Karol Niewiadomski;Patrick Koch;Jacek Bojarski;Paul Evans;Niek Moonen;Mark Sumner;David W. P. Thomas
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引用次数: 0

摘要

本文提出了一种皮尔逊随机游走方法,用于模拟$N$并联电力电子变流器的电磁发射。本文首次提出了一种测试随机漫步方法的方法。该方法在两个方面得到了验证:首先,通过一个由8个半桥式电力电子变换器组成的简化装置的仿真。其次,使用由3个dc/dc转换器组成的实验装置对其进行验证。在复域进行验证,并通过理论累积分布函数和经验累积分布函数比较共模电流的幅值。最后,导出了开关频率某一特定谐波下电磁干扰减小的概率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Pearson's Random Walk Method of Estimating the Electromagnetic Emissions of $N$ Parallel Connected Power Electronic Converters
This article presents a Pearson's random walk approach for modelling the electromagnetic emissions of $N$ parallel connected power electronic converters. For the first time, a methodology that enables testing the random walk approach is presented. This methodology is validated in two ways: firstly, via simulations of a simplified setup consisting of 8 half-bridge power electronic converters. Secondly, it is validated with the use of an experimental setup consisting of 3 dc/dc converters. The verification is done in the complex domain, as well as by comparing the magnitude of the common mode current via the theoretical cumulative distribution function and the empirical cumulative distribution function. Finally, the probability of electromagnetic interference reduction at a specific harmonic of the switching frequency is derived.
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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