{"title":"了解地面辐射源对量子器件错误率的贡献","authors":"Gioele Casagranda;Marzio Vallero;Flavio Vella;Paolo Rech","doi":"10.1109/TNS.2025.3537036","DOIUrl":null,"url":null,"abstract":"Quantum computing (QC), despite being a highly promising computational paradigm, suffers from an incredibly high radiation sensitivity. Recent discoveries highlighted that the impact of a particle in the quantum bit (qubit) is tens of thousands of times more likely to induce a fault compared to traditional CMOS devices. Moreover, the deposited charge quickly diffuses in the substrate affecting multiple qubits, inducing faults that can persist for hundreds of seconds. In this article, we aim to better understand the effect of different radiation sources and mechanisms of energy propagation on quantum devices. We present data from the simulation of more than 18 billion particle interactions. Through GEANT4 simulations, we compare the effect of neutrons, alpha particles, muons, and gamma rays in a quantum device. We combine nonequilibrium generation probability with natural flux to identify the most harmful radiation source for qubits. We found that muons are, by far, the more likely cause of faults in qubits. Moreover, through G4CMP simulations, we track the energy propagation in the substrate. We show that even particle hits far from the qubit can lead to energy transmission to the superconductor, also pointing out that this mechanism is 1000 times more likely than a direct energy deposition on the qubit. In addition, we show that the time persistency of secondary particles in the substrate is in the order of <inline-formula> <tex-math>$100~\\mu $ </tex-math></inline-formula>s. Finally, we look at particle impacts on a four-qubit device to show that with a common layout, multiple-qubit are likely to be corrupted.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1324-1334"},"PeriodicalIF":1.9000,"publicationDate":"2025-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Understanding the Contributions of Terrestrial Radiation Sources to Error Rates in Quantum Devices\",\"authors\":\"Gioele Casagranda;Marzio Vallero;Flavio Vella;Paolo Rech\",\"doi\":\"10.1109/TNS.2025.3537036\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantum computing (QC), despite being a highly promising computational paradigm, suffers from an incredibly high radiation sensitivity. Recent discoveries highlighted that the impact of a particle in the quantum bit (qubit) is tens of thousands of times more likely to induce a fault compared to traditional CMOS devices. Moreover, the deposited charge quickly diffuses in the substrate affecting multiple qubits, inducing faults that can persist for hundreds of seconds. In this article, we aim to better understand the effect of different radiation sources and mechanisms of energy propagation on quantum devices. We present data from the simulation of more than 18 billion particle interactions. Through GEANT4 simulations, we compare the effect of neutrons, alpha particles, muons, and gamma rays in a quantum device. We combine nonequilibrium generation probability with natural flux to identify the most harmful radiation source for qubits. We found that muons are, by far, the more likely cause of faults in qubits. Moreover, through G4CMP simulations, we track the energy propagation in the substrate. We show that even particle hits far from the qubit can lead to energy transmission to the superconductor, also pointing out that this mechanism is 1000 times more likely than a direct energy deposition on the qubit. In addition, we show that the time persistency of secondary particles in the substrate is in the order of <inline-formula> <tex-math>$100~\\\\mu $ </tex-math></inline-formula>s. Finally, we look at particle impacts on a four-qubit device to show that with a common layout, multiple-qubit are likely to be corrupted.\",\"PeriodicalId\":13406,\"journal\":{\"name\":\"IEEE Transactions on Nuclear Science\",\"volume\":\"72 4\",\"pages\":\"1324-1334\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Nuclear Science\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10887039/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nuclear Science","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10887039/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Understanding the Contributions of Terrestrial Radiation Sources to Error Rates in Quantum Devices
Quantum computing (QC), despite being a highly promising computational paradigm, suffers from an incredibly high radiation sensitivity. Recent discoveries highlighted that the impact of a particle in the quantum bit (qubit) is tens of thousands of times more likely to induce a fault compared to traditional CMOS devices. Moreover, the deposited charge quickly diffuses in the substrate affecting multiple qubits, inducing faults that can persist for hundreds of seconds. In this article, we aim to better understand the effect of different radiation sources and mechanisms of energy propagation on quantum devices. We present data from the simulation of more than 18 billion particle interactions. Through GEANT4 simulations, we compare the effect of neutrons, alpha particles, muons, and gamma rays in a quantum device. We combine nonequilibrium generation probability with natural flux to identify the most harmful radiation source for qubits. We found that muons are, by far, the more likely cause of faults in qubits. Moreover, through G4CMP simulations, we track the energy propagation in the substrate. We show that even particle hits far from the qubit can lead to energy transmission to the superconductor, also pointing out that this mechanism is 1000 times more likely than a direct energy deposition on the qubit. In addition, we show that the time persistency of secondary particles in the substrate is in the order of $100~\mu $ s. Finally, we look at particle impacts on a four-qubit device to show that with a common layout, multiple-qubit are likely to be corrupted.
期刊介绍:
The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years.
The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.