Sb和Bi掺杂对分子束外延生长SnTe层的影响

IF 4.3 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Qihua Zhang*, Mary Kathleen Caucci, Maria Hilse, Analaura Diaz Gomez, Susan Sinnott and Stephanie Law*, 
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引用次数: 0

摘要

SnTe具有良好的热电性能,近室温相变和铁电性,以及拓扑上不平凡的能带结构,是一种有趣的窄带隙半导体。然而,由于Sn空位的负形成能导致SnTe薄膜始终是p型的,这限制了它们在热电和自旋电子领域的应用潜力。虽然已经尝试开发n型SnTe体晶体,但这些努力尚未扩展到薄膜。本文报道了用分子束外延法在SnTe薄膜中掺入Sb和Bi掺杂剂的效果。我们发现Sb是一种不合适的电子掺杂剂,对SnTe表面形貌有不利的影响。然而,将Bi掺入SnTe薄膜中,观察到自由空穴浓度降低了2.5倍,并保留了光滑的表面。不幸的是,高铋通量会导致双缺陷的形成。利用密度泛函数理论的第一性原理计算,我们发现Sb和Bi掺杂剂的首选取代位点取决于生长条件:带正电的SbSn+杂质只在重贫锡条件下存在,而BiSn+在除富锡生长条件外的所有条件下都有利。此外,对于Sb和Bi掺杂剂,取代位可能形成配合物,Sn空位充当浅受体,这将是限制自由空穴浓度降低的重要因素。虽然薄膜仍然是p型,但这项工作是发展n型SnTe薄膜的第一步。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Effects of Sb and Bi Doping in SnTe Layers Grown by Molecular Beam Epitaxy

Effects of Sb and Bi Doping in SnTe Layers Grown by Molecular Beam Epitaxy

SnTe is an interesting narrow-band-gap semiconductor due to its good thermoelectric performance, near-room-temperature phase transition and ferroelectricity, and topologically nontrivial band structure. Yet, the negative formation energy of Sn vacancies results in SnTe thin films always being heavily p-type, which limits their potential in thermoelectric and spintronic applications. While attempts have been made to develop n-type SnTe bulk crystals, these efforts have not extended to thin films. In this work, we report on the effect of incorporating Sb and Bi dopants in SnTe thin films by molecular beam epitaxy. We found that Sb is an unsuitable electron dopant and has a detrimental effect on the SnTe surface morphology. However, by incorporating Bi into SnTe films, a 2.5× reduction in free hole concentrations is observed and a smooth surface is retained. Unfortunately, high Bi fluxes lead to the formation of twin defects. Using first-principles calculations with density functional theory, we show that the preferred substitutional site of the Sb and Bi dopants depends on the growth conditions: positively charged SbSn+ impurity is only found in heavily Sn-poor conditions, while BiSn+ is favored in all but the Sn-rich growth conditions. Moreover, for both Sb and Bi dopants, the substitutional sites may form complexes, with Sn vacancies acting as shallow acceptors, which would be a significant factor limiting the reduction of free hole concentrations. Although the films remain p-type, this work is the first step toward developing n-type SnTe thin films.

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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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