{"title":"高质量p型触点,用于高工作功能半金属TiS2电极的原子薄MoTe2晶体管","authors":"Boyuan Di, Xinlu Li, Xiaokun Wen, Wenyu Lei, Xinyue Xu, Wenchao Kong, Haixin Chang, Jia Zhang, Wenfeng Zhang","doi":"10.1021/acsami.5c04059","DOIUrl":null,"url":null,"abstract":"High-performance p-type atomically thin transistors are fundamental components in CMOS-based digital logic circuits for beyond-silicon electronics. Compared with the recent breakthrough in high-quality semimetal contacts approaching the quantum limit on n-type atomically thin channel transistors, achieving high-performance p-type analogues with high-quality contacts remains challenging, which was mainly hindered by the lack of proper high-work-function metallic electrodes with Fermi level unpinning capacity. Herein, we demonstrate that semimetal TiS<sub>2</sub> electrodes prepared with a damage-free transfer process can be a feasible option for p-type atomically thin MoTe<sub>2</sub> transistors. Owing to its intrinsic large work function (∼5.3 eV) and high-quality contacts with negligible Schottky barrier at the TiS<sub>2</sub>/MoTe<sub>2</sub> interface, the scaled p-type bilayer MoTe<sub>2</sub> transistor with 500 nm channel length and the monolayer transistor with 800 nm channel length exhibit a high on-state current (<i>I</i><sub>on</sub>) of 100 μA/μm with the on/off ratio (<i>I</i><sub>on/off</sub>) over 10<sup>6</sup> and an <i>I</i><sub>on</sub> of 68 μA/μm with the <i>I</i><sub>on/off</sub> ratio over 10<sup>7</sup>, respectively. Such a demonstration will enable monolithic atomically thin MoTe<sub>2</sub>-based beyond-silicon electronics via the common CMOS technology.","PeriodicalId":5,"journal":{"name":"ACS Applied Materials & Interfaces","volume":"267 1","pages":""},"PeriodicalIF":8.2000,"publicationDate":"2025-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-Quality P-type Contacts for Atomically Thin MoTe2 Transistors with High-Work-Function Semimetal TiS2 Electrodes\",\"authors\":\"Boyuan Di, Xinlu Li, Xiaokun Wen, Wenyu Lei, Xinyue Xu, Wenchao Kong, Haixin Chang, Jia Zhang, Wenfeng Zhang\",\"doi\":\"10.1021/acsami.5c04059\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"High-performance p-type atomically thin transistors are fundamental components in CMOS-based digital logic circuits for beyond-silicon electronics. Compared with the recent breakthrough in high-quality semimetal contacts approaching the quantum limit on n-type atomically thin channel transistors, achieving high-performance p-type analogues with high-quality contacts remains challenging, which was mainly hindered by the lack of proper high-work-function metallic electrodes with Fermi level unpinning capacity. Herein, we demonstrate that semimetal TiS<sub>2</sub> electrodes prepared with a damage-free transfer process can be a feasible option for p-type atomically thin MoTe<sub>2</sub> transistors. Owing to its intrinsic large work function (∼5.3 eV) and high-quality contacts with negligible Schottky barrier at the TiS<sub>2</sub>/MoTe<sub>2</sub> interface, the scaled p-type bilayer MoTe<sub>2</sub> transistor with 500 nm channel length and the monolayer transistor with 800 nm channel length exhibit a high on-state current (<i>I</i><sub>on</sub>) of 100 μA/μm with the on/off ratio (<i>I</i><sub>on/off</sub>) over 10<sup>6</sup> and an <i>I</i><sub>on</sub> of 68 μA/μm with the <i>I</i><sub>on/off</sub> ratio over 10<sup>7</sup>, respectively. Such a demonstration will enable monolithic atomically thin MoTe<sub>2</sub>-based beyond-silicon electronics via the common CMOS technology.\",\"PeriodicalId\":5,\"journal\":{\"name\":\"ACS Applied Materials & Interfaces\",\"volume\":\"267 1\",\"pages\":\"\"},\"PeriodicalIF\":8.2000,\"publicationDate\":\"2025-04-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Materials & Interfaces\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1021/acsami.5c04059\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Materials & Interfaces","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1021/acsami.5c04059","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
High-Quality P-type Contacts for Atomically Thin MoTe2 Transistors with High-Work-Function Semimetal TiS2 Electrodes
High-performance p-type atomically thin transistors are fundamental components in CMOS-based digital logic circuits for beyond-silicon electronics. Compared with the recent breakthrough in high-quality semimetal contacts approaching the quantum limit on n-type atomically thin channel transistors, achieving high-performance p-type analogues with high-quality contacts remains challenging, which was mainly hindered by the lack of proper high-work-function metallic electrodes with Fermi level unpinning capacity. Herein, we demonstrate that semimetal TiS2 electrodes prepared with a damage-free transfer process can be a feasible option for p-type atomically thin MoTe2 transistors. Owing to its intrinsic large work function (∼5.3 eV) and high-quality contacts with negligible Schottky barrier at the TiS2/MoTe2 interface, the scaled p-type bilayer MoTe2 transistor with 500 nm channel length and the monolayer transistor with 800 nm channel length exhibit a high on-state current (Ion) of 100 μA/μm with the on/off ratio (Ion/off) over 106 and an Ion of 68 μA/μm with the Ion/off ratio over 107, respectively. Such a demonstration will enable monolithic atomically thin MoTe2-based beyond-silicon electronics via the common CMOS technology.
期刊介绍:
ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.