M. Tornay , A. Ramiandrasoa , M. Bouschet , J.-P. Perez , J.-L. Reverchon , B. Simozrag , C. Bonvalot , I. Ribet , N. Péré-Laperne , P. Christol
{"title":"nBn红外光电探测器中少数载流子寿命和工作电压与阻挡层厚度的关系","authors":"M. Tornay , A. Ramiandrasoa , M. Bouschet , J.-P. Perez , J.-L. Reverchon , B. Simozrag , C. Bonvalot , I. Ribet , N. Péré-Laperne , P. Christol","doi":"10.1016/j.infrared.2025.105846","DOIUrl":null,"url":null,"abstract":"<div><div>XBn InAs/InAsSb architectures are now a standard to design high performance mid-wave infrared photodetectors with increased operating temperatures. In this paper, the influence of barrier layer (<em>BL</em>) thickness on the electrical and electro-optical characteristics of such detectors is investigated. The study shows that this parameter has a key role on turn-on voltage and carrier lifetimes. A model is derived to analyze the dependence of this voltage on BL thickness and doping conditions. It is found that an optimum thickness comprised between 100 and 140 nm can minimize it. Additionally, a decrease in the lifetimes of minority carriers is observed as the BL thickness is increased. This behavior is studied as a function of temperature and applied bias voltage.</div></div>","PeriodicalId":13549,"journal":{"name":"Infrared Physics & Technology","volume":"148 ","pages":"Article 105846"},"PeriodicalIF":3.1000,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Minority carrier lifetime and operating voltage dependence on the barrier layer thickness in nBn infrared photodetectors\",\"authors\":\"M. Tornay , A. Ramiandrasoa , M. Bouschet , J.-P. Perez , J.-L. Reverchon , B. Simozrag , C. Bonvalot , I. Ribet , N. Péré-Laperne , P. Christol\",\"doi\":\"10.1016/j.infrared.2025.105846\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>XBn InAs/InAsSb architectures are now a standard to design high performance mid-wave infrared photodetectors with increased operating temperatures. In this paper, the influence of barrier layer (<em>BL</em>) thickness on the electrical and electro-optical characteristics of such detectors is investigated. The study shows that this parameter has a key role on turn-on voltage and carrier lifetimes. A model is derived to analyze the dependence of this voltage on BL thickness and doping conditions. It is found that an optimum thickness comprised between 100 and 140 nm can minimize it. Additionally, a decrease in the lifetimes of minority carriers is observed as the BL thickness is increased. This behavior is studied as a function of temperature and applied bias voltage.</div></div>\",\"PeriodicalId\":13549,\"journal\":{\"name\":\"Infrared Physics & Technology\",\"volume\":\"148 \",\"pages\":\"Article 105846\"},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2025-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Infrared Physics & Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1350449525001392\",\"RegionNum\":3,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared Physics & Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1350449525001392","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
Minority carrier lifetime and operating voltage dependence on the barrier layer thickness in nBn infrared photodetectors
XBn InAs/InAsSb architectures are now a standard to design high performance mid-wave infrared photodetectors with increased operating temperatures. In this paper, the influence of barrier layer (BL) thickness on the electrical and electro-optical characteristics of such detectors is investigated. The study shows that this parameter has a key role on turn-on voltage and carrier lifetimes. A model is derived to analyze the dependence of this voltage on BL thickness and doping conditions. It is found that an optimum thickness comprised between 100 and 140 nm can minimize it. Additionally, a decrease in the lifetimes of minority carriers is observed as the BL thickness is increased. This behavior is studied as a function of temperature and applied bias voltage.
期刊介绍:
The Journal covers the entire field of infrared physics and technology: theory, experiment, application, devices and instrumentation. Infrared'' is defined as covering the near, mid and far infrared (terahertz) regions from 0.75um (750nm) to 1mm (300GHz.) Submissions in the 300GHz to 100GHz region may be accepted at the editors discretion if their content is relevant to shorter wavelengths. Submissions must be primarily concerned with and directly relevant to this spectral region.
Its core topics can be summarized as the generation, propagation and detection, of infrared radiation; the associated optics, materials and devices; and its use in all fields of science, industry, engineering and medicine.
Infrared techniques occur in many different fields, notably spectroscopy and interferometry; material characterization and processing; atmospheric physics, astronomy and space research. Scientific aspects include lasers, quantum optics, quantum electronics, image processing and semiconductor physics. Some important applications are medical diagnostics and treatment, industrial inspection and environmental monitoring.