门控共振隧道二极管中单层二硫化钼的探测电子带结构

IF 8.2 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Chengjie Zhou, Hui Li, Zhenqiao Huang, Chun Yu Wan, Zijing Jin, Junwei Liu, Jiannong Wang
{"title":"门控共振隧道二极管中单层二硫化钼的探测电子带结构","authors":"Chengjie Zhou, Hui Li, Zhenqiao Huang, Chun Yu Wan, Zijing Jin, Junwei Liu, Jiannong Wang","doi":"10.1021/acsami.4c21712","DOIUrl":null,"url":null,"abstract":"Experimental determination of band structures of monolayer transition metal dichalcogenides (TMDCs) is crucially important in the design and tailoring of the properties of TMDCs. Resonant tunneling spectroscopy (RTS) is an effective technique to probe the band structures of low-dimensional systems by measuring the density of states (DOS) and energy dispersions. Here, we report the investigation of the band structure of monolayer MoS<sub>2</sub> (ML-MoS<sub>2</sub>) in a gate-controlled resonant tunneling diode. Three distinct resonant tunneling kinks are observed in the characteristic current–voltage curves at 0.47, 0.70, and 0.81 V, respectively, which correspond to the conduction band local minimum of ML-MoS<sub>2</sub> at K, Q<sub>1</sub>, and Q<sub>2</sub> points. When applying a large positive gate voltage to enhance ML-MoS<sub>2</sub> conductivity, the three resonant kinks shift to lower bias at 0.10, 0.32, and 0.39 V, respectively, which is in excellent agreement with the theoretical calculations. Our work offers an effective and more precise way to explore the electronic band structures of TMDCs using RTS.","PeriodicalId":5,"journal":{"name":"ACS Applied Materials & Interfaces","volume":"120 1","pages":""},"PeriodicalIF":8.2000,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Probing Electronic Band Structure of Monolayer MoS2 in Gate-Controlled Resonant Tunneling Diodes\",\"authors\":\"Chengjie Zhou, Hui Li, Zhenqiao Huang, Chun Yu Wan, Zijing Jin, Junwei Liu, Jiannong Wang\",\"doi\":\"10.1021/acsami.4c21712\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Experimental determination of band structures of monolayer transition metal dichalcogenides (TMDCs) is crucially important in the design and tailoring of the properties of TMDCs. Resonant tunneling spectroscopy (RTS) is an effective technique to probe the band structures of low-dimensional systems by measuring the density of states (DOS) and energy dispersions. Here, we report the investigation of the band structure of monolayer MoS<sub>2</sub> (ML-MoS<sub>2</sub>) in a gate-controlled resonant tunneling diode. Three distinct resonant tunneling kinks are observed in the characteristic current–voltage curves at 0.47, 0.70, and 0.81 V, respectively, which correspond to the conduction band local minimum of ML-MoS<sub>2</sub> at K, Q<sub>1</sub>, and Q<sub>2</sub> points. When applying a large positive gate voltage to enhance ML-MoS<sub>2</sub> conductivity, the three resonant kinks shift to lower bias at 0.10, 0.32, and 0.39 V, respectively, which is in excellent agreement with the theoretical calculations. Our work offers an effective and more precise way to explore the electronic band structures of TMDCs using RTS.\",\"PeriodicalId\":5,\"journal\":{\"name\":\"ACS Applied Materials & Interfaces\",\"volume\":\"120 1\",\"pages\":\"\"},\"PeriodicalIF\":8.2000,\"publicationDate\":\"2025-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Materials & Interfaces\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1021/acsami.4c21712\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Materials & Interfaces","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1021/acsami.4c21712","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

单层过渡金属二硫族化合物(TMDCs)带结构的实验测定对TMDCs性能的设计和裁剪至关重要。共振隧道光谱(RTS)是一种通过测量态密度(DOS)和能量色散来探测低维体系能带结构的有效技术。本文报道了一种门控共振隧道二极管中单层MoS2 (ML-MoS2)的能带结构。在0.47、0.70和0.81 V的特征电流-电压曲线中分别观察到三个不同的谐振隧道结,它们对应于ML-MoS2在K、Q1和Q2点的导带局部最小值。当施加较大的正栅极电压以增强ML-MoS2的电导率时,三个谐振扭分别在0.10、0.32和0.39 V时向低偏置偏移,这与理论计算非常吻合。我们的工作为利用RTS探索TMDCs的电子能带结构提供了一种有效和更精确的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Probing Electronic Band Structure of Monolayer MoS2 in Gate-Controlled Resonant Tunneling Diodes

Probing Electronic Band Structure of Monolayer MoS2 in Gate-Controlled Resonant Tunneling Diodes
Experimental determination of band structures of monolayer transition metal dichalcogenides (TMDCs) is crucially important in the design and tailoring of the properties of TMDCs. Resonant tunneling spectroscopy (RTS) is an effective technique to probe the band structures of low-dimensional systems by measuring the density of states (DOS) and energy dispersions. Here, we report the investigation of the band structure of monolayer MoS2 (ML-MoS2) in a gate-controlled resonant tunneling diode. Three distinct resonant tunneling kinks are observed in the characteristic current–voltage curves at 0.47, 0.70, and 0.81 V, respectively, which correspond to the conduction band local minimum of ML-MoS2 at K, Q1, and Q2 points. When applying a large positive gate voltage to enhance ML-MoS2 conductivity, the three resonant kinks shift to lower bias at 0.10, 0.32, and 0.39 V, respectively, which is in excellent agreement with the theoretical calculations. Our work offers an effective and more precise way to explore the electronic band structures of TMDCs using RTS.
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来源期刊
ACS Applied Materials & Interfaces
ACS Applied Materials & Interfaces 工程技术-材料科学:综合
CiteScore
16.00
自引率
6.30%
发文量
4978
审稿时长
1.8 months
期刊介绍: ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.
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