利用柔性梯形波形减小i-TOF激光雷达的系统误差

IF 5.6 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Xuan Ma;Hui Lin;Shangquan Wu;Xiaoguang Liu
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引用次数: 0

摘要

与常用的3d测量技术相比,间接飞行时间(i-TOF)系统在体积、成本、功耗、精度、范围和角度分辨率方面具有显著优势。因此,它们在智能识别、同步定位和地图绘制(SLAM)和增强现实(AR)中得到了广泛的应用。然而,由于系统误差和随机误差的干扰,目前的i-TOF系统只能达到几十毫米以内的测距精度。这严重限制了它们在高精度场景中的应用,例如面部识别支付、先进制造和智能医疗保健。在这项工作中,我们强调在所有误差中影响精度的最重要因素是被称为摆动的系统误差。它是一个与其他系统和随机误差非线性耦合的高维复杂函数,使其难以独立分离、表征和补偿。鉴于此,我们开发了一种基于可调梯形函数的测距仿真和系统误差优化方法,该方法来源于实际驱动光波形整形。为了证明所提出的理论和方法的有效性,我们对i-ToF系统进行了测量。通过对光波形的频率、占空比(DR)和上升/下降沿比(RFER)进行全局优化,在RFER为5.6%、33.2%、频率为100 MHz的条件下,系统总误差从±19 mm减小到±4.5 mm。通过开发针对最佳DR和RFER进行优化的驱动电路,系统误差有望进一步降低到亚毫米级。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Systematic Error Reduction of i-TOF LiDARs Using Flexible Trapezoidal Waveforms
Compared with common 3-D measurements technologies, indirect time-of-flight (i-TOF) systems offers significant advantages in volume, cost, power consumption, accuracy, range, and angular resolution. As such, they have found widespread applications in intelligent recognition, simultaneous localization and mapping (SLAM), and augmented reality (AR). However, due to the interference of systematic and random errors, current i-TOF systems achieve ranging accuracy only within several tens of millimeters. This severely limits their applications in high-precision scenarios, such as facial recognition payments, advanced manufacturing, and intelligent healthcare. In this work, we highlight that the most significant factor affecting accuracy among all errors is a systematic error known as wiggling. It is a high-dimensional complex function that nonlinearly couples with other systematic and random errors, making it difficult to independently separate, characterize, and compensate for. In light of this, we develop a methodology for ranging simulation and systematic error optimization based on adjustable trapezoidal functions derived from actual drive light waveform shaping. To demonstrate the effectiveness of the proposed theory and methodology, we perform measurement on an i-ToF system. Through global optimization of the frequency, duty ratio (DR), and rising/falling edge ratio (RFER) of the optical waveform, the total systematic error can be reduced from ±19 to ±4.5 mm under the conditions of a 5.6% RFER, a 33.2%, and a frequency of 100 MHz. By developing drive circuits that are optimized for the best DR and RFER, the systematic error is expected to be further reduced to the submillimeter level.
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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