{"title":"TIADC信道间失配校正算法","authors":"Chengjie Wang, Shengmin Yang, Yuhua Liang","doi":"10.1016/j.mejo.2025.106688","DOIUrl":null,"url":null,"abstract":"<div><div>To address the issues in existing algorithms related to calibration accuracy, hardware utilization, or the trade-off between calibration speed and accuracy, this paper proposes a fully digital background calibration method including parallel and serial architecture, which can reduce hardware utilization and supports the expansion to an arbitrary number of channels.</div><div>We performed board-level verification on an FPGA for the proposed algorithm. The results of the FPGA board-level verification match those of the MATLAB behavioral simulation. At an input frequency of 0.025 <span><math><mrow><msub><mi>f</mi><mi>s</mi></msub></mrow></math></span>, the SNDR and SFDR improved by 8.59 dB and 11.54 dB, respectively, and the effective number of bits (ENOB) increased by 1.42 bits. At an input frequency of 0.05 <span><math><mrow><msub><mi>f</mi><mi>s</mi></msub></mrow></math></span>, the SNDR and SFDR improved by 20.89 dB and 13.65 dB, respectively, and the ENOB increased by 2.27 bits. At an input frequency of 0.2 <span><math><mrow><msub><mi>f</mi><mi>s</mi></msub></mrow></math></span>, the SNDR and SFDR improved by 11.86 dB and 17.89 dB, respectively, and the ENOB increased by 1.97 bits. The output layout size was 500 μm × 550 μm.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"160 ","pages":"Article 106688"},"PeriodicalIF":1.9000,"publicationDate":"2025-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Algorithm of the inter-channel mismatches calibration in TIADC\",\"authors\":\"Chengjie Wang, Shengmin Yang, Yuhua Liang\",\"doi\":\"10.1016/j.mejo.2025.106688\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>To address the issues in existing algorithms related to calibration accuracy, hardware utilization, or the trade-off between calibration speed and accuracy, this paper proposes a fully digital background calibration method including parallel and serial architecture, which can reduce hardware utilization and supports the expansion to an arbitrary number of channels.</div><div>We performed board-level verification on an FPGA for the proposed algorithm. The results of the FPGA board-level verification match those of the MATLAB behavioral simulation. At an input frequency of 0.025 <span><math><mrow><msub><mi>f</mi><mi>s</mi></msub></mrow></math></span>, the SNDR and SFDR improved by 8.59 dB and 11.54 dB, respectively, and the effective number of bits (ENOB) increased by 1.42 bits. At an input frequency of 0.05 <span><math><mrow><msub><mi>f</mi><mi>s</mi></msub></mrow></math></span>, the SNDR and SFDR improved by 20.89 dB and 13.65 dB, respectively, and the ENOB increased by 2.27 bits. At an input frequency of 0.2 <span><math><mrow><msub><mi>f</mi><mi>s</mi></msub></mrow></math></span>, the SNDR and SFDR improved by 11.86 dB and 17.89 dB, respectively, and the ENOB increased by 1.97 bits. The output layout size was 500 μm × 550 μm.</div></div>\",\"PeriodicalId\":49818,\"journal\":{\"name\":\"Microelectronics Journal\",\"volume\":\"160 \",\"pages\":\"Article 106688\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-04-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1879239125001377\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239125001377","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Algorithm of the inter-channel mismatches calibration in TIADC
To address the issues in existing algorithms related to calibration accuracy, hardware utilization, or the trade-off between calibration speed and accuracy, this paper proposes a fully digital background calibration method including parallel and serial architecture, which can reduce hardware utilization and supports the expansion to an arbitrary number of channels.
We performed board-level verification on an FPGA for the proposed algorithm. The results of the FPGA board-level verification match those of the MATLAB behavioral simulation. At an input frequency of 0.025 , the SNDR and SFDR improved by 8.59 dB and 11.54 dB, respectively, and the effective number of bits (ENOB) increased by 1.42 bits. At an input frequency of 0.05 , the SNDR and SFDR improved by 20.89 dB and 13.65 dB, respectively, and the ENOB increased by 2.27 bits. At an input frequency of 0.2 , the SNDR and SFDR improved by 11.86 dB and 17.89 dB, respectively, and the ENOB increased by 1.97 bits. The output layout size was 500 μm × 550 μm.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.