Minzheng Jiang;Shengchen Xue;Milan Majoros;Edward W. Collings;Mike D. Sumption
{"title":"叠带电缆电流共享的有限元模拟ICR、ITR、缺陷数和热边界条件的影响","authors":"Minzheng Jiang;Shengchen Xue;Milan Majoros;Edward W. Collings;Mike D. Sumption","doi":"10.1109/TASC.2025.3546919","DOIUrl":null,"url":null,"abstract":"This research explored current sharing and quench evolution in rare-earth barium copper oxide (ReBCO) based superconducting cables intended for use in the High Energy Physics (HEP) accelerator magnets. We used 3D finite element simulation studies of three-tape stack (carpet stack) cables. A given number of defects per tape length was assumed, along with specified electrical and thermal resistance values within and between tapes. Previous studies with a single defect in a three-tape stack cable showed that in addition to intra and inter-tape electrical resistivity, values of thermal resistivity and thermal boundary conditions were needed to determine a current sharing level. Here we defined the current sharing level as CSR = <inline-formula><tex-math>$I_{{cable}\\_{defect}}$</tex-math></inline-formula>/<inline-formula><tex-math>$I_{{cable}\\_{no}\\_{defect}}$</tex-math></inline-formula> just before thermal runaway. The current sharing level varied with inter-strand contact resistance (ICR), inter-strand thermal resistance (ITR), and thermal boundary conditions. As one example a three-tape stack cable with an interlayer electrical contact efficiency, η = 5400 μΩ*cm<sup>2</sup>, an interlayer thermal contact efficiency, ω = 5.54 K*m<sup>2</sup>/W, liquid helium cooling on the outer surface of the cable, and one defect (set at 10% <inline-formula><tex-math>${I}_{{c}}$</tex-math></inline-formula>) in the central tape had a current sharing value of 0.91 (i.e., the ability to achieve 95% of nominal {defect free} <inline-formula><tex-math>${I}_{{c,cable}}$</tex-math></inline-formula> before a quench). Increasing the number of defects per unit length in the central tape reduced the achievable I/<inline-formula><tex-math>${I\\neg}_{{c,cable}}\\,$</tex-math></inline-formula>from 0.95 to 0.87.","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"35 5","pages":"1-5"},"PeriodicalIF":1.7000,"publicationDate":"2025-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"FEM Modeling of Current Sharing in Tape Stack Cables; Influence of ICR, ITR, Defect Number, and Thermal Boundary Conditions\",\"authors\":\"Minzheng Jiang;Shengchen Xue;Milan Majoros;Edward W. Collings;Mike D. Sumption\",\"doi\":\"10.1109/TASC.2025.3546919\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This research explored current sharing and quench evolution in rare-earth barium copper oxide (ReBCO) based superconducting cables intended for use in the High Energy Physics (HEP) accelerator magnets. We used 3D finite element simulation studies of three-tape stack (carpet stack) cables. A given number of defects per tape length was assumed, along with specified electrical and thermal resistance values within and between tapes. Previous studies with a single defect in a three-tape stack cable showed that in addition to intra and inter-tape electrical resistivity, values of thermal resistivity and thermal boundary conditions were needed to determine a current sharing level. Here we defined the current sharing level as CSR = <inline-formula><tex-math>$I_{{cable}\\\\_{defect}}$</tex-math></inline-formula>/<inline-formula><tex-math>$I_{{cable}\\\\_{no}\\\\_{defect}}$</tex-math></inline-formula> just before thermal runaway. The current sharing level varied with inter-strand contact resistance (ICR), inter-strand thermal resistance (ITR), and thermal boundary conditions. As one example a three-tape stack cable with an interlayer electrical contact efficiency, η = 5400 μΩ*cm<sup>2</sup>, an interlayer thermal contact efficiency, ω = 5.54 K*m<sup>2</sup>/W, liquid helium cooling on the outer surface of the cable, and one defect (set at 10% <inline-formula><tex-math>${I}_{{c}}$</tex-math></inline-formula>) in the central tape had a current sharing value of 0.91 (i.e., the ability to achieve 95% of nominal {defect free} <inline-formula><tex-math>${I}_{{c,cable}}$</tex-math></inline-formula> before a quench). Increasing the number of defects per unit length in the central tape reduced the achievable I/<inline-formula><tex-math>${I\\\\neg}_{{c,cable}}\\\\,$</tex-math></inline-formula>from 0.95 to 0.87.\",\"PeriodicalId\":13104,\"journal\":{\"name\":\"IEEE Transactions on Applied Superconductivity\",\"volume\":\"35 5\",\"pages\":\"1-5\"},\"PeriodicalIF\":1.7000,\"publicationDate\":\"2025-03-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Applied Superconductivity\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10908707/\",\"RegionNum\":3,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Applied Superconductivity","FirstCategoryId":"101","ListUrlMain":"https://ieeexplore.ieee.org/document/10908707/","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
FEM Modeling of Current Sharing in Tape Stack Cables; Influence of ICR, ITR, Defect Number, and Thermal Boundary Conditions
This research explored current sharing and quench evolution in rare-earth barium copper oxide (ReBCO) based superconducting cables intended for use in the High Energy Physics (HEP) accelerator magnets. We used 3D finite element simulation studies of three-tape stack (carpet stack) cables. A given number of defects per tape length was assumed, along with specified electrical and thermal resistance values within and between tapes. Previous studies with a single defect in a three-tape stack cable showed that in addition to intra and inter-tape electrical resistivity, values of thermal resistivity and thermal boundary conditions were needed to determine a current sharing level. Here we defined the current sharing level as CSR = $I_{{cable}\_{defect}}$/$I_{{cable}\_{no}\_{defect}}$ just before thermal runaway. The current sharing level varied with inter-strand contact resistance (ICR), inter-strand thermal resistance (ITR), and thermal boundary conditions. As one example a three-tape stack cable with an interlayer electrical contact efficiency, η = 5400 μΩ*cm2, an interlayer thermal contact efficiency, ω = 5.54 K*m2/W, liquid helium cooling on the outer surface of the cable, and one defect (set at 10% ${I}_{{c}}$) in the central tape had a current sharing value of 0.91 (i.e., the ability to achieve 95% of nominal {defect free} ${I}_{{c,cable}}$ before a quench). Increasing the number of defects per unit length in the central tape reduced the achievable I/${I\neg}_{{c,cable}}\,$from 0.95 to 0.87.
期刊介绍:
IEEE Transactions on Applied Superconductivity (TAS) contains articles on the applications of superconductivity and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Large scale applications include magnets for power applications such as motors and generators, for magnetic resonance, for accelerators, and cable applications such as power transmission.