使用饱和吸收光谱的铀激光产生的等离子体的高分辨率光谱

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Mathew P. Polek , Mark C. Phillips , Farhat N. Beg , Sivanandan S. Harilal
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引用次数: 0

摘要

激光烧蚀羽流或激光产生的等离子体(LPPs)的高分辨率光谱学在各种应用中都很有价值,包括测量拥挤光谱特征、确定光谱常数、表征等离子体和进行同位素分析。然而,等离子体中各种谱线展宽机制限制了其在几种应用中的应用。在这里,我们提出了使用饱和吸收光谱(SAS)在铀LPP中进行无多普勒线宽分析。我们证明了SAS可以有效地获得线宽≤20 MHz的无多普勒Lamb倾角曲线。定量了不同压力和探针强度下饱和对多普勒加宽吸收和兰姆倾角的影响,并讨论了它们对等离子体特性测量的影响。最后,我们证明了兰姆倾角的线宽可以用来定量估计等离子体中的压力和自然展宽。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

High-resolution spectroscopy of uranium laser-produced plasma using saturated absorption spectroscopy

High-resolution spectroscopy of uranium laser-produced plasma using saturated absorption spectroscopy
High-resolution spectroscopy of laser ablation plumes or laser-produced plasmas (LPPs) is valuable for various applications, including measuring crowded spectral features, determining spectroscopic constants, characterizing plasmas, and performing isotopic analysis. However, various line broadening mechanisms in plasmas limit its use for several applications. Here, we present the use of saturated absorption spectroscopy (SAS) for Doppler-free linewidth analysis in a uranium LPP. We demonstrate that SAS is effective in obtaining Doppler-free Lamb dip profiles with linewidths on the order of ≤ 20 MHz. The effects of saturation on the Doppler-broadened absorption and Lamb dip profiles at different pressures and probe intensities are quantified, and their impact on measurements of plasma properties is discussed. Finally, we show that the linewidths of the Lamb dips can be used for quantitative estimates of pressure and natural broadening in the plasma.
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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