具有同步写入和存储功能的新型8T2R NVSRAM

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Bowen Su , Jueping Cai , Yuxin Zhang , Jizhang Chen , Yiding Wang
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引用次数: 0

摘要

提出了一种新型的8T2R非易失性静态随机存储器(NVSRAM),该存储器在写入节点电压的同时将数据存储在两个忆阻器中,以应对意外掉电情况。通过将以前nvsram的写入和存储缩短为一步,可以省去保持模式,并且由于必须使用额外的控制信号将用于存储的忆阻器插入电路中,因此能耗降低。写入前的忆阻器初始化也可以跳过。只需要恢复供电,恢复节点电压正常,不需要对其他接口进行预充电。与现有NVSRAM相比,8T2R NVSRAM通过减少操作步骤和所需的外部激励,大大提高了电路效率,降低了功耗。在8T2R中增加了一个额外的节点电压作为参考,这增加了存储以及两种忆阻器状态的可靠性。仿真结果表明,该算法能够很好地平衡读余量和写余量,具有较好的鲁棒性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel 8T2R NVSRAM with synchronizing write and store function
A novel 8T2R non-volatile static randomized memory (NVSRAM) is proposed to meet accidental power-down situations by storing data into two memristors simultaneously with writing the node voltages. By shortening the writing and storing of previous NVSRAMs into one-step, the hold-on mode can be omitted and the energy consumption decreased since it is necessary to use additional control signals for inserting memristors for storage into the circuit. The initialization of memristors before writing can also be skipped. Only the power supply is needed to be recovered, and the restoration of node voltages can be achieved normally without the pre-charge of other ports. Compared with existing NVSRAMs, 8T2R NVSRAM greatly improves the circuit efficiency and reduces the power consumption by minimizing the operation steps and the required external excitation. An extra node voltage is added as a reference in 8T2R, which increases the reliability of the storage along with both memristor states. Simulations demonstrated that the proposed 8T2R can balance read margin and write margin well and has good robustness.
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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