Bowen Su , Jueping Cai , Yuxin Zhang , Jizhang Chen , Yiding Wang
{"title":"具有同步写入和存储功能的新型8T2R NVSRAM","authors":"Bowen Su , Jueping Cai , Yuxin Zhang , Jizhang Chen , Yiding Wang","doi":"10.1016/j.mejo.2025.106667","DOIUrl":null,"url":null,"abstract":"<div><div>A novel 8T2R non-volatile static randomized memory (NVSRAM) is proposed to meet accidental power-down situations by storing data into two memristors simultaneously with writing the node voltages. By shortening the writing and storing of previous NVSRAMs into one-step, the hold-on mode can be omitted and the energy consumption decreased since it is necessary to use additional control signals for inserting memristors for storage into the circuit. The initialization of memristors before writing can also be skipped. Only the power supply is needed to be recovered, and the restoration of node voltages can be achieved normally without the pre-charge of other ports. Compared with existing NVSRAMs, 8T2R NVSRAM greatly improves the circuit efficiency and reduces the power consumption by minimizing the operation steps and the required external excitation. An extra node voltage is added as a reference in 8T2R, which increases the reliability of the storage along with both memristor states. Simulations demonstrated that the proposed 8T2R can balance read margin and write margin well and has good robustness.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"160 ","pages":"Article 106667"},"PeriodicalIF":1.9000,"publicationDate":"2025-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A novel 8T2R NVSRAM with synchronizing write and store function\",\"authors\":\"Bowen Su , Jueping Cai , Yuxin Zhang , Jizhang Chen , Yiding Wang\",\"doi\":\"10.1016/j.mejo.2025.106667\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>A novel 8T2R non-volatile static randomized memory (NVSRAM) is proposed to meet accidental power-down situations by storing data into two memristors simultaneously with writing the node voltages. By shortening the writing and storing of previous NVSRAMs into one-step, the hold-on mode can be omitted and the energy consumption decreased since it is necessary to use additional control signals for inserting memristors for storage into the circuit. The initialization of memristors before writing can also be skipped. Only the power supply is needed to be recovered, and the restoration of node voltages can be achieved normally without the pre-charge of other ports. Compared with existing NVSRAMs, 8T2R NVSRAM greatly improves the circuit efficiency and reduces the power consumption by minimizing the operation steps and the required external excitation. An extra node voltage is added as a reference in 8T2R, which increases the reliability of the storage along with both memristor states. Simulations demonstrated that the proposed 8T2R can balance read margin and write margin well and has good robustness.</div></div>\",\"PeriodicalId\":49818,\"journal\":{\"name\":\"Microelectronics Journal\",\"volume\":\"160 \",\"pages\":\"Article 106667\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-03-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S187923912500116X\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S187923912500116X","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A novel 8T2R NVSRAM with synchronizing write and store function
A novel 8T2R non-volatile static randomized memory (NVSRAM) is proposed to meet accidental power-down situations by storing data into two memristors simultaneously with writing the node voltages. By shortening the writing and storing of previous NVSRAMs into one-step, the hold-on mode can be omitted and the energy consumption decreased since it is necessary to use additional control signals for inserting memristors for storage into the circuit. The initialization of memristors before writing can also be skipped. Only the power supply is needed to be recovered, and the restoration of node voltages can be achieved normally without the pre-charge of other ports. Compared with existing NVSRAMs, 8T2R NVSRAM greatly improves the circuit efficiency and reduces the power consumption by minimizing the operation steps and the required external excitation. An extra node voltage is added as a reference in 8T2R, which increases the reliability of the storage along with both memristor states. Simulations demonstrated that the proposed 8T2R can balance read margin and write margin well and has good robustness.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.