种子驱动的逐步结晶(SDSC)在MOCVD上生长金红石GeO2薄膜

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Imteaz Rahaman, Botong Li, Bobby G. Duersch, Hunter D. Ellis and Kai Fu*, 
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引用次数: 0

摘要

二氧化锗(r-GeO2)是一种新兴的超宽带隙(UWBG)半导体,由于其双极性掺杂能力,在电力电子领域具有巨大的潜力。然而,在金属-有机化学气相沉积(MOCVD)过程中,如r-TiO2衬底上的相偏析对获得高质量的薄膜构成了重大障碍。迄今为止,传统的生长参数优化方法在薄膜覆盖率和薄膜质量方面都不是很理想。为了解决这个问题,本研究采用了种子驱动的逐步结晶(SDSC)生长方法,在富含r-GeO2种子的预模板基底上进行多个顺序沉积步骤。该过程开始于最初的180分钟沉积,以建立r-GeO2成核种子,随后是一系列较短的沉积步骤(90、60、60、60、60和60分钟)。这种分步生长策略逐步将晶体覆盖率提高到57.4%、77.49、79.73、93.27、99.17,最终达到100%。同时,晶体质量得到了显著改善,x射线衍射摇摆曲线的半最大值全宽度(FWHM)减小了约30%。这些发现证明了SDSC方法在克服相偏析和获得高质量、大面积r-GeO2薄膜方面的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Seed-Driven Stepwise Crystallization (SDSC) for Growing Rutile GeO2 Films via MOCVD

Seed-Driven Stepwise Crystallization (SDSC) for Growing Rutile GeO2 Films via MOCVD

Germanium dioxide (r-GeO2) is an emerging ultrawide bandgap (UWBG) semiconductor with significant potential for power electronics, thanks to its ambipolar doping capability. However, phase segregation during metal–organic chemical vapor deposition (MOCVD) on substrates like r-TiO2 has posed a significant barrier to achieving high-quality films. Conventional optimization of growth parameters has been found so far not very insufficient in film coverage and film quality. To address this, a seed-driven stepwise crystallization (SDSC) growth approach was employed in this study, featuring multiple sequential deposition steps on a pretemplated substrate enriched with r-GeO2 seeds. The process began with an initial 180 min deposition to establish r-GeO2 nucleation seeds, followed by a sequence of shorter deposition steps (90, 60, 60, 60, 60, and 60 min). This stepwise growth strategy progressively increased the crystalline coverage to 57.4, 77.49, 79.73, 93.27, 99.17, and ultimately 100%. Concurrently, the crystalline quality improved substantially, evidenced by a ∼30% reduction in the Full Width at Half Maximum (FWHM) of X-ray diffraction rocking curves. These findings demonstrate the potential of the SDSC approach for overcoming phase segregation and achieving high-quality, large-area r-GeO2 films.

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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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