{"title":"源同步接口全数字宽范围去斜双边校正电路","authors":"Yongshan Wang;Fei Liu;Fangyuan Jin;Jian Huo","doi":"10.1109/TCSII.2025.3540008","DOIUrl":null,"url":null,"abstract":"This brief presents an all-digital and wide-range de-skew circuit with dual-edge correction scheme for source synchronous interfaces to achieve precise synchronization between data and clock. The proposed scheme not only aligns the rising edges of data and clock signals, but also compensates for the falling edge position offsets of multi-bit parallel data, which can address the narrowing of data valid window caused by skew and pulse-width distortion. A two-stage digitally-controlled delay line is utilized to achieve wide-range de-skew. Besides, a half-cycle delay line method is adopted for clock duty-cycle correction, while generating a 90-degree phase shift to optimize the sampling margin. The test chip is fabricated in 180nm CMOS process, and each data path with the proposed de-skew circuit occupies 0.0453mm2. The chip testing results show that the timing skew between data and clock is reduced to within 28ps, and the pulse-width correction error is less than 1.7% when the duty cycle of the input clock pattern data signal ranges from 28% to 65%.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"72 4","pages":"534-538"},"PeriodicalIF":4.0000,"publicationDate":"2025-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An All-Digital and Wide-Range De-Skew Circuit With Dual-Edge Correction Scheme for Source Synchronous Interfaces\",\"authors\":\"Yongshan Wang;Fei Liu;Fangyuan Jin;Jian Huo\",\"doi\":\"10.1109/TCSII.2025.3540008\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This brief presents an all-digital and wide-range de-skew circuit with dual-edge correction scheme for source synchronous interfaces to achieve precise synchronization between data and clock. The proposed scheme not only aligns the rising edges of data and clock signals, but also compensates for the falling edge position offsets of multi-bit parallel data, which can address the narrowing of data valid window caused by skew and pulse-width distortion. A two-stage digitally-controlled delay line is utilized to achieve wide-range de-skew. Besides, a half-cycle delay line method is adopted for clock duty-cycle correction, while generating a 90-degree phase shift to optimize the sampling margin. The test chip is fabricated in 180nm CMOS process, and each data path with the proposed de-skew circuit occupies 0.0453mm2. The chip testing results show that the timing skew between data and clock is reduced to within 28ps, and the pulse-width correction error is less than 1.7% when the duty cycle of the input clock pattern data signal ranges from 28% to 65%.\",\"PeriodicalId\":13101,\"journal\":{\"name\":\"IEEE Transactions on Circuits and Systems II: Express Briefs\",\"volume\":\"72 4\",\"pages\":\"534-538\"},\"PeriodicalIF\":4.0000,\"publicationDate\":\"2025-02-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Circuits and Systems II: Express Briefs\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10877875/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems II: Express Briefs","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10877875/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
An All-Digital and Wide-Range De-Skew Circuit With Dual-Edge Correction Scheme for Source Synchronous Interfaces
This brief presents an all-digital and wide-range de-skew circuit with dual-edge correction scheme for source synchronous interfaces to achieve precise synchronization between data and clock. The proposed scheme not only aligns the rising edges of data and clock signals, but also compensates for the falling edge position offsets of multi-bit parallel data, which can address the narrowing of data valid window caused by skew and pulse-width distortion. A two-stage digitally-controlled delay line is utilized to achieve wide-range de-skew. Besides, a half-cycle delay line method is adopted for clock duty-cycle correction, while generating a 90-degree phase shift to optimize the sampling margin. The test chip is fabricated in 180nm CMOS process, and each data path with the proposed de-skew circuit occupies 0.0453mm2. The chip testing results show that the timing skew between data and clock is reduced to within 28ps, and the pulse-width correction error is less than 1.7% when the duty cycle of the input clock pattern data signal ranges from 28% to 65%.
期刊介绍:
TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes:
Circuits: Analog, Digital and Mixed Signal Circuits and Systems
Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic
Circuits and Systems, Power Electronics and Systems
Software for Analog-and-Logic Circuits and Systems
Control aspects of Circuits and Systems.