用时间序列会聚束电子衍射研究石墨烯上单个金纳米粒子同时在实空间和衍射空间中的动力学

IF 2.2 3区 工程技术 Q1 MICROSCOPY
Sara Mustafi , Rongsheng Cai , Sam Sullivan-Allsop , Matthew Smith , Nicholas J. Clark , Matthew Lindley , Ding Peng , Kostya S. Novoselov , Sarah J. Haigh , Tatiana Latychevskaia
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引用次数: 0

摘要

在二维材料上进行聚束电子衍射(CBED)可在一次强度测量中同时记录同一样品的真实空间图像(尺寸为数十纳米)和衍射图样。在本研究中,我们采用时间序列 CBED 来观察沉积在石墨烯上的单个金纳米粒子。在零阶 CBED 盘中可直接观察到探测区域的实空间图像,包括单个金纳米粒子的数量、尺寸和位置,而金纳米粒子的原子排列则可从高阶 CBED 盘的强度分布中获得。从时间序列 CBED 图形中,我们记录了单个金纳米粒子旋转 4° 的运动轨迹。我们还观察到在金纳米粒子的 CBED 盘之间形成的面衍射线̶ 强烈的亮线,这可以用金纳米粒子面的衍射来解释。这项工作展示了 CBED 是一种以金纳米粒子为模型平台研究石墨烯上吸附物的有用技术,并为今后研究沉积在石墨烯上的不同物体铺平了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Dynamics of single Au nanoparticles on graphene simultaneously in real- and diffraction space by time-series convergent beam electron diffraction
Convergent beam electron diffraction (CBED) on two-dimensional materials allows simultaneous recording of the real-space image (tens of nanometers in size) and diffraction pattern of the same sample in one single-shot intensity measurement. In this study, we employ time-series CBED to visualize single Au nanoparticles deposited on graphene. The real-space image of the probed region, with the amount, size, and positions of single Au nanoparticles, is directly observed in the zero-order CBED disk, while the atomic arrangement of the Au nanoparticles is available from the intensity distributions in the higher-order CBED disks. From the time-series CBED patterns, the movement of a single Au nanoparticle with rotation up to 4° was recorded. We also observed facet diffraction lines ̶ intense bright lines formed between the CBED disks of the Au nanoparticle, which we explain by diffraction at the Au nanoparticle's facets. This work showcases CBED as a useful technique for studying adsorbates on graphene using Au nanoparticles as a model platform, and paves the way for future studies of different objects deposited on graphene.
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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