等离子体聚焦装置中氢离子轰击诱导石墨表面和结构改变的研究

MirMohammadreza Seyedhabashi , Maryam Ebrahimi , Ehsanollah Noori , Mehdi Janbazi
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引用次数: 0

摘要

本文研究了mather型等离子体聚焦装置产生的高能氢离子对聚变反应堆中关键等离子体面材料石墨的影响。石墨样品被氢离子以增量的影响照射(1,10,20次)。利用光学显微镜(OM)和扫描电镜(SEM)分析了表面变化(空洞、裂纹、熔化)。由此产生的表面变化在SEM和OM图像中清晰可见。对经过逐渐辐照和点溅射的样品进行显微分析,发现样品表面出现空洞和局部熔化,这与离子影响的增加有关,特别是在20次辐照后。利用x射线衍射(XRD)对高能质子辐照引起的石墨结构变化进行了定量分析。辐照后样品的XRD谱显示,由于瞬态热处理,样品的峰位发生位移,晶体生长(再结晶),表明结构发生了明显的变化。为了表征等离子体聚焦装置产生的氢离子,利用了李氏码和法拉第杯探测器。实验结果表明,离子的平均能量约为46 keV。使用SRIM代码模拟了离子穿透深度、氢潴留和辐射损伤。仿真结果表明,最大损伤发生在200 nm深度,每次射击的损伤率为0.024个原子位移(dpa)。在220纳米深度,氢离子的浓度最高,为0.6%。这些发现证明了石墨在聚变相关条件下对氢诱导损伤的敏感性。该研究验证了等离子聚焦装置是PFM检测的有效工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigating graphite surface and structural modifications induced by hydrogen ion bombardment in a plasma focus device
This study investigates the effects of high-energy hydrogen ions generated by a Mather-type plasma focus device on graphite, a critical plasma-facing material (PFM) in fusion reactors. Graphite samples were irradiated with hydrogen ions at incremental fluences (1, 10, 20 shots). Surface modifications (voids, cracks, melting) were analyzed using optical microscopy (OM) and scanning electron microscopy (SEM). The resulting surface changes were clearly visible in the SEM and OM images. Microscopic analysis of the samples subjected to gradual irradiation and point sputtering revealed voids and localized melting on the sample surfaces, which were correlated with increasing ion fluence, particularly after 20 shots. Structural changes in the graphite caused by high-energy proton irradiation were quantified via X-ray diffraction (XRD). The XRD spectrum of the irradiated samples exhibited shifts in peak positions and recrystallization (crystal growth) due to transient thermal annealing, indicating significant structural alterations. To characterize the hydrogen ions produced by the plasma focus device, the Lee code and a Faraday cup detector were utilized. The experimental results showed that the average ion energy was approximately 46 keV. Ion penetration depth, hydrogen retention, and radiation damage were simulated using the SRIM code. The simulation results indicated that the maximum damage occurred at a depth of 200 nm, with a damage rate of 0.024 displacements per atom (dpa) per shot. The highest concentration of hydrogen ions, measured at 0.6 %, was found at a depth of 220 nm. These findings demonstrate graphite's susceptibility to hydrogen-induced damage under fusion-relevant conditions. The study validates plasma focus devices as effective tools for PFM testing.
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