光子计数与强化电荷耦合装置(ICCD) - 1 .深入的探测器表征

IF 3.8 2区 化学 Q1 SPECTROSCOPY
George C.-Y. Chan
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引用次数: 0

摘要

本研究提出了一种用于弱光测量的增强电荷耦合器件(ICCD)的深入表征,重点是在光谱应用中识别单光子事件。目标是为光子计数(PC)中使用ICCDs建立基础,它比传统的模拟探测器读出具有优势,如本研究的第二部分所示,使用激光诱导击穿光谱。重点放在ICCD工作参数的优化,以有效区分信号尖峰和检测器噪声。对探测器暗噪声、单光子探测阈值设置、ICCD工作参数(如增强器增益、模数转换速率和前置放大器设置)进行了表征和讨论。增强器增益是影响信号尖峰大小和离子反馈现象的最关键参数。提出了一种系统的在最小化误报和最大化计数效率之间选择最佳操作参数的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Photon counting with intensified charge coupled device (ICCD) – I. In-depth detector characterization

Photon counting with intensified charge coupled device (ICCD) – I. In-depth detector characterization
This study presents an in-depth characterization of an intensified charge-coupled device (ICCD) for low-light measurement, with a focus on identifying single-photon events in spectroscopic applications. The objective is to establish a foundation for using ICCDs in photon counting (PC), which offers advantages over conventional analog detector readout, as demonstrated in Part II of this study with laser-induced breakdown spectroscopy. Emphasis is placed on optimization of ICCD operating parameters for effective differentiation between signal spikes and detector noise. Detector dark noise, threshold setting for single-photon detection, and ICCD operating parameters such as intensifier gain, analog-to-digital conversion rate, and pre-amplifier setting, are characterized and discussed. The intensifier gain is identified as the most critical parameter, significantly affecting signal spike size and ion feedback phenomena. A systematic approach is proposed for selecting optimized operating parameters between minimizing false positives and maximizing counting efficiency.
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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