MeV Cq+离子诱导厚Cu和Au靶的x射线产生截面

IF 1.4 3区 物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION
J. Hussain , L.D. Yu , I. Ahmad , T. Ali , S. Ullah , M. Shahid , U. Tippawan
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引用次数: 0

摘要

本研究测量了由1 MeV至22 MeV多电荷态c离子诱导的厚Cu和Au靶的K-、L-和m壳层x射线产生截面(XPCSs)作为离子能量和电荷态的函数,并与使用he离子进行了比较。XPCS测量基于Merzbacher-Lewis关系。在重c离子辐照的材料中观察到x射线能量位移和峰展宽,表明多重电离(MI)过程对c离子起作用,而对氦离子不起作用。氦离子诱导的实验xpcs与理论模型预测一致,不表现出电荷态依赖,而c离子诱导的xpcs表现出更复杂的模式,这取决于离子能量和入射电荷态。将离子电荷态效应的复杂性扩展到厚目标形式下的平衡电荷态(ECS)。用MI和ECS修正的理论模型对测量数据的预测有所改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
X-ray production cross sections of thick Cu and Au targets induced by MeV Cq+ ions
This study measured K-, L-, and M-shell X-ray production cross sections (XPCSs) of thick Cu and Au targets induced by 1 MeV to 22 MeV multiple-charge-state C-ions as a function of ion energy and charge state, compared with using He-ions. XPCS measurements were based on the Merzbacher-Lewis relation. X-ray energy shifts and peak broadening were observed in materials irradiated by heavy C-ions, demonstrating that multiple ionization (MI) processes are at play for C-ions but not for He-ions. While the experimental XPCSs induced by He-ions aligned with predictions of theoretical models and did not exhibit charge state dependence, the XPCSs induced by C-ions exhibited more complex patterns, depending on ion energy and incident charge state. The complexity of the ion charge state effect was extended to the equilibrium charge state (ECS) in the thick target formalism. Theoretical models modified with MI and ECS exhibited improved predictions of the measured data.
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来源期刊
CiteScore
2.80
自引率
7.70%
发文量
231
审稿时长
1.9 months
期刊介绍: Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.
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