氧化锡薄膜自旋镀膜的制备:浓度的影响

IF 3 Q3 Physics and Astronomy
Hanane Meddas , Lakel Abdelghani , Dakhlaoui Amel , Bouaicha Saliha , Slatnia Randa , Aida Mohamed Salah Belahssen Okba
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引用次数: 0

摘要

采用低成本的自旋镀膜方法在玻璃衬底上沉积氧化锡(SnO2)薄膜。研究了溶液的摩尔浓度对其显微结构、光学和电学性能的影响。为此,在0.1 ~ 0.25 m范围内制备了不同摩尔浓度的氯化锡盐溶液,并用x射线衍射仪(XRD)和扫描电镜(SEM)等技术对合成的膜的结构和形貌进行了表征。通过紫外可见光谱和四探针电导率测量研究了其光学和电性能。所有样品的XRD谱图均显示出结晶良好、纯度高、具有四方金红石结构的SnO2薄膜。扫描电镜图像显示薄膜光滑致密,无针孔。光学分析表明,当浓度从0.1 m增加到0.25 m时,薄膜的可见光透明度可达98%,带隙从3.97 eV减小到3.82 eV,薄膜的电导率在76 ~ 100 (Ω.cm)-1之间变化。在低溶液浓度条件下制备的薄膜,其优值最大,为9.8 × 10-3。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Elaboration of spin coated deposition of tin oxide thin films: Effect of concentration
Tin oxide (SnO2) thin films were deposited on glass substrates using a cost effective spin coating method. The effect of solution molarity on their microstructural, optical and electrical properties was investigated. For this purpose, solutions of tin chloride salt were prepared with various molarity in the range of 0.1 to 0.25 M. The synthetized films structure and morphology were characterized by different techniques such as: X-rays diffraction (XRD) and scanning electron microscopy (SEM). The optical and electrical properties were studied by mean of UV visible spectroscopy and four probes conductivity measurement. The XRD patterns of all samples revealed well-crystallized and pure SnO2 films with tetragonal rutile structure. The SEM images reveal a smooth and dense film pinholes free. The optical analyses show that the films exhibit an optical transparency that reaches up to 98 % in the visible range and that the optical band gap decreases from 3.97 to 3.82  eV when the concentration increases from 0.1 to 0.25 M. The films electrical conductivity varies in the range from 76 to 100 (Ω.cm)-1. The largest figure of merit of 9.8 × 10-3, was measured in the films prepared at low solution concentration.
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来源期刊
Results in Optics
Results in Optics Physics and Astronomy-Atomic and Molecular Physics, and Optics
CiteScore
2.50
自引率
0.00%
发文量
115
审稿时长
71 days
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