在硫的ICP和直流电弧近红外光谱中观察到新的原子发射谱线

IF 3.2 2区 化学 Q1 SPECTROSCOPY
Dmitry Antonov , Emmanuil Silkis , Vladimir Kolotov
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引用次数: 0

摘要

本文在ICP、氦、氩直流电弧等离子体中观测到9条未知的S - I发射谱线。采用分辨率为0.06 nm的线性CMOS阵列探测器,高灵敏度Ebert光纤光谱仪在910 ~ 970 nm光谱范围内进行观测。波长测量精度为0.003 nm。在该光谱区域内所有观测到的硫谱线的波长和相对强度,包括新观测到的硫谱线,列于表中。与ICP相比,直流电弧等离子体中的硫光谱表现出明显的波长偏移。这些变化也被测量并呈现在表中。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

New atomic emission lines observed in ICP and dc arc near-infrared spectrum of sulfur

New atomic emission lines observed in ICP and dc arc near-infrared spectrum of sulfur
In present work, nine previously unknown S I emission lines were observed and described in ICP, helium and argon dc arc plasma. The observations were performed in 910–970 nm spectral range via high-sensitive Ebert fiber-optic spectrometer with linear CMOS array detector with resolution 0.06 nm. Measurements of wavelengths were performed with 0.003 nm accuracy. The wavelengths and relative intensities of all observed sulfur lines in this spectral region, including new ones, were presented in table. Sulfur spectra in dc arc plasma were found to exhibit significant wavelength shifts when compared to ICP ones. These shifts were measured and presented in table as well.
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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