应力补偿型TiO2和SiO2多层抗反射涂层低温PEALD工艺的研究

IF 5.5 3区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Duy Thanh Cu, Kuan-Yu Ko, Wen-Hao Cho, Chao-Te Lee, Meng-Chi Li, Chien-Cheng Kuo
{"title":"应力补偿型TiO2和SiO2多层抗反射涂层低温PEALD工艺的研究","authors":"Duy Thanh Cu,&nbsp;Kuan-Yu Ko,&nbsp;Wen-Hao Cho,&nbsp;Chao-Te Lee,&nbsp;Meng-Chi Li,&nbsp;Chien-Cheng Kuo","doi":"10.1186/s11671-025-04238-2","DOIUrl":null,"url":null,"abstract":"<div><p>This study presents a low-temperature plasma-enhanced atomic layer deposition (PEALD) technique for fabricating high-performance, stress-reduced anti-reflective coatings (ARCs). To the best of our knowledge, this is the first extensive study on titanium dioxide (TiO<sub>2</sub>)/silicon dioxide (SiO<sub>2</sub>) stacking with PEALD at such a low temperature of 70 °C, which may help to overcome high-temperature deposition issues and mechanical stress for polymer substrates. Despite the presence of impurities in the low-temperature deposited films, the measured extinction coefficient (k &lt; 10<sup>–4</sup>) indicates negligible optical absorption in both TiO<sub>2</sub> and SiO<sub>2</sub> layers, ensuring optimal performance for ARCs. Stress compensation is observed between tensile TiO<sub>2</sub> films (≈ 220 MPa) and compressive SiO<sub>2</sub> films (≈ − 35 MPa). For multi-layer ARCs, this combination strategy leads to a very low total stress of 48 MPa, which is a big step forward for stress control in optical coatings. This stress-reduction effect remains effective even when the thickness difference reaches up to 9.6%. This consistency has been demonstrated in real-world applications, where achieving an ideal level of thinness can be challenging. The optimized process at 150 W plasma power produces high-quality optics with an average reflectivity of 0.35% in the visible range while maintaining low stress, a significant achievement in low temperature deposited optical coatings. The choice of common, cost-effective materials like SiO<sub>2</sub> and TiO<sub>2</sub> makes this approach easily scalable for industrial use and can see the future of manufacturing ARCs for various applications. These films are characterized by a low density of defects and an amorphous structure with the smoothness of their surface being close to one atomic monolayer (≈ 0.2 nm), which indicates their high optical quality, comparable to films deposited at high temperatures. The low-temperature PEALD presented in this work not only pushes the boundary in advanced optical coatings but also enlarges the capacity in coating temperature-sensitive substrates and complex 3D structures. This innovation paves the way for applications in bendable electronics, high-performance optical components, and next generation display devices.</p></div>","PeriodicalId":51136,"journal":{"name":"Nanoscale Research Letters","volume":"20 1","pages":""},"PeriodicalIF":5.5000,"publicationDate":"2025-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1186/s11671-025-04238-2.pdf","citationCount":"0","resultStr":"{\"title\":\"Development of an innovative low-temperature PEALD process for stress-compensated TiO2 and SiO2 multilayer anti-reflective coatings\",\"authors\":\"Duy Thanh Cu,&nbsp;Kuan-Yu Ko,&nbsp;Wen-Hao Cho,&nbsp;Chao-Te Lee,&nbsp;Meng-Chi Li,&nbsp;Chien-Cheng Kuo\",\"doi\":\"10.1186/s11671-025-04238-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This study presents a low-temperature plasma-enhanced atomic layer deposition (PEALD) technique for fabricating high-performance, stress-reduced anti-reflective coatings (ARCs). To the best of our knowledge, this is the first extensive study on titanium dioxide (TiO<sub>2</sub>)/silicon dioxide (SiO<sub>2</sub>) stacking with PEALD at such a low temperature of 70 °C, which may help to overcome high-temperature deposition issues and mechanical stress for polymer substrates. Despite the presence of impurities in the low-temperature deposited films, the measured extinction coefficient (k &lt; 10<sup>–4</sup>) indicates negligible optical absorption in both TiO<sub>2</sub> and SiO<sub>2</sub> layers, ensuring optimal performance for ARCs. Stress compensation is observed between tensile TiO<sub>2</sub> films (≈ 220 MPa) and compressive SiO<sub>2</sub> films (≈ − 35 MPa). For multi-layer ARCs, this combination strategy leads to a very low total stress of 48 MPa, which is a big step forward for stress control in optical coatings. This stress-reduction effect remains effective even when the thickness difference reaches up to 9.6%. This consistency has been demonstrated in real-world applications, where achieving an ideal level of thinness can be challenging. The optimized process at 150 W plasma power produces high-quality optics with an average reflectivity of 0.35% in the visible range while maintaining low stress, a significant achievement in low temperature deposited optical coatings. The choice of common, cost-effective materials like SiO<sub>2</sub> and TiO<sub>2</sub> makes this approach easily scalable for industrial use and can see the future of manufacturing ARCs for various applications. These films are characterized by a low density of defects and an amorphous structure with the smoothness of their surface being close to one atomic monolayer (≈ 0.2 nm), which indicates their high optical quality, comparable to films deposited at high temperatures. The low-temperature PEALD presented in this work not only pushes the boundary in advanced optical coatings but also enlarges the capacity in coating temperature-sensitive substrates and complex 3D structures. This innovation paves the way for applications in bendable electronics, high-performance optical components, and next generation display devices.</p></div>\",\"PeriodicalId\":51136,\"journal\":{\"name\":\"Nanoscale Research Letters\",\"volume\":\"20 1\",\"pages\":\"\"},\"PeriodicalIF\":5.5000,\"publicationDate\":\"2025-03-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://link.springer.com/content/pdf/10.1186/s11671-025-04238-2.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nanoscale Research Letters\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://link.springer.com/article/10.1186/s11671-025-04238-2\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanoscale Research Letters","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1186/s11671-025-04238-2","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

本研究提出了一种低温等离子体增强原子层沉积(PEALD)技术,用于制造高性能、应力降低的抗反射涂层(arc)。据我们所知,这是第一次在70°C的低温下对二氧化钛(TiO2)/二氧化硅(SiO2)与PEALD堆积进行广泛的研究,这可能有助于克服高温沉积问题和聚合物衬底的机械应力。尽管低温沉积薄膜中存在杂质,但测量的消光系数(k < 10-4)表明TiO2和SiO2层的光吸收可以忽略不计,从而确保了arc的最佳性能。在TiO2薄膜(≈220 MPa)和SiO2薄膜(≈−35 MPa)之间存在应力补偿。对于多层电弧,这种组合策略使得总应力极低,仅为48 MPa,这是光学涂层应力控制的一大进步。当厚度差达到9.6%时,这种应力减小效果仍然有效。这种一致性已经在实际应用程序中得到了证明,在实际应用程序中,实现理想的瘦度可能具有挑战性。在150 W等离子体功率下,优化的工艺生产出高质量的光学器件,在可见光范围内平均反射率为0.35%,同时保持低应力,这是低温沉积光学涂层的重要成就。选择常见的,具有成本效益的材料,如SiO2和TiO2,使这种方法易于扩展到工业用途,并且可以看到为各种应用制造arc的未来。这些薄膜具有低缺陷密度和非晶结构的特点,其表面光滑度接近一个原子单层(≈0.2 nm),这表明它们具有高光学质量,可与高温沉积的薄膜相比较。本文提出的低温PEALD不仅推动了先进光学涂层的发展,而且扩大了涂层温度敏感基板和复杂3D结构的能力。这一创新为可弯曲电子产品、高性能光学元件和下一代显示设备的应用铺平了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of an innovative low-temperature PEALD process for stress-compensated TiO2 and SiO2 multilayer anti-reflective coatings

This study presents a low-temperature plasma-enhanced atomic layer deposition (PEALD) technique for fabricating high-performance, stress-reduced anti-reflective coatings (ARCs). To the best of our knowledge, this is the first extensive study on titanium dioxide (TiO2)/silicon dioxide (SiO2) stacking with PEALD at such a low temperature of 70 °C, which may help to overcome high-temperature deposition issues and mechanical stress for polymer substrates. Despite the presence of impurities in the low-temperature deposited films, the measured extinction coefficient (k < 10–4) indicates negligible optical absorption in both TiO2 and SiO2 layers, ensuring optimal performance for ARCs. Stress compensation is observed between tensile TiO2 films (≈ 220 MPa) and compressive SiO2 films (≈ − 35 MPa). For multi-layer ARCs, this combination strategy leads to a very low total stress of 48 MPa, which is a big step forward for stress control in optical coatings. This stress-reduction effect remains effective even when the thickness difference reaches up to 9.6%. This consistency has been demonstrated in real-world applications, where achieving an ideal level of thinness can be challenging. The optimized process at 150 W plasma power produces high-quality optics with an average reflectivity of 0.35% in the visible range while maintaining low stress, a significant achievement in low temperature deposited optical coatings. The choice of common, cost-effective materials like SiO2 and TiO2 makes this approach easily scalable for industrial use and can see the future of manufacturing ARCs for various applications. These films are characterized by a low density of defects and an amorphous structure with the smoothness of their surface being close to one atomic monolayer (≈ 0.2 nm), which indicates their high optical quality, comparable to films deposited at high temperatures. The low-temperature PEALD presented in this work not only pushes the boundary in advanced optical coatings but also enlarges the capacity in coating temperature-sensitive substrates and complex 3D structures. This innovation paves the way for applications in bendable electronics, high-performance optical components, and next generation display devices.

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来源期刊
Nanoscale Research Letters
Nanoscale Research Letters 工程技术-材料科学:综合
CiteScore
11.30
自引率
0.00%
发文量
110
审稿时长
48 days
期刊介绍: Nanoscale Research Letters (NRL) provides an interdisciplinary forum for communication of scientific and technological advances in the creation and use of objects at the nanometer scale. NRL is the first nanotechnology journal from a major publisher to be published with Open Access.
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